Strain in Nanocrysttaline Powders of GaN and SiC as Measured by X-ray Diffraction

Bogdan F. Palosz 6Ewa Grzanka 5,6Stanisław Gierlotka 6Svitlana Stelmakh 6Roman Pielaszek 5,6Witold Łojkowski 6Ulrich Bismayer 2J. Neuefeind H. P. Weber J. F. Janik 3R. L. Wells Witold Palosz 

1. Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland
2. University of Hamburg, Mineralogisch-Pertographisches Institut, Hamburg, Germany
3. AGH University of Science and Technology (AGH), al. Mickiewicza 30, Kraków 30-059, Poland
4. Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland
5. Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland
6. Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland

Abstract

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Submitted: 2003-02-16 17:33
Revised:   2009-06-08 12:55