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Strain in Nanocrysttaline Powders of GaN and SiC as Measured by X-ray Diffraction

Bogdan F. Palosz ⁶, Ewa Grzanka ^5,6, Stanisław Gierlotka ⁶, Svitlana Stelmakh ⁶, Roman Pielaszek ^5,6, Witold Łojkowski ⁶, Ulrich Bismayer ², J. Neuefeind , H. P. Weber , J. F. Janik ³, R. L. Wells , Witold Palosz

1. Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland
2. University of Hamburg, Mineralogisch-Pertographisches Institut, Hamburg, Germany
3. AGH University of Science and Technology (AGH), al. Mickiewicza 30, Kraków 30-059, Poland
4. Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland
5. Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland
6. Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland

Abstract

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Strain in Nanocrysttaline Powders of GaN and SiC as Measured by X-ray Diffraction

Submitted: 2003-02-16 17:33 Revised: 2009-06-08 12:55