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Scanning Electron Microscopy Investigations and Analysis of Nanostructures

Adam M. Presz ,  Jan T. Mizeracki ,  Witold Łojkowski 


Several examples will be given on application of Field Emission Scanning Electron Microscopy in the studies of nanopartciles and nanostrcutres, including polymers. Application of BSE detector, in-lens detector and other detectors will be ilustrated. Methods to optimise the image will be explained. 


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Presentation: Polish Research Projects at Nano and Advanced Materials Workshop and Fair, by Adam M. Presz
See On-line Journal of Nano and Advanced Materials Workshop and Fair

Submitted: 2013-08-11 20:22
Revised:   2013-09-06 23:12