|Search for content and authors|
Precise determination of full Grain Size Distribution from diffraction peak profile as a result of kinematical theory of diffraction for polidispersive nanomaterials
|Roman Pielaszek , Witold Łojkowski|
Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland
Size of crystallites strongly influences diffraction peak profiles, especially in range of nanometers. In present work we show that classical methods of determination of the average crystallite size from peak width (Scherrer method) or shape (Warren-Averbach method) are accurate only for monodispersive powders. Systematical deviations of measured grain size in polidispersive (real) case ranges between few tens percent and infinity.
Presentation: oral at E-MRS Fall Meeting 2003, Symposium B, by Roman Pielaszek
See On-line Journal of E-MRS Fall Meeting 2003
Submitted: 2003-04-29 22:17 Revised: 2009-06-08 12:55