Time
|
Duration
|
Type
|
Presenting person
|
Title
|
|
|
|
|
|
|
Poster |
Adrien Tribu |
Optical properties of ZnSe and CdSe/ZnSe single nanowires. |
September 17th, Monday |
|
| 14:00 |
Session I : Data analysis for spectroscopic ellipsometry - room 208 |
| 14:00 |
00:35:00 |
Invited |
James N. Hilfiker |
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry |
| 14:35 |
00:20:00 |
Oral |
Peter Petrik |
Nanocrystals characterization in porous silicon using model dielectric function |
| 14:55 |
00:20:00 |
Oral |
Jordi Sancho Parramon |
Optical characterization of HfO2 by spectroscopic ellipsometry: dispersion models and direct data inversion |
| 15:15 |
00:20:00 |
Oral |
Mickael Gilliot |
Use of Gaussian Voigt oscillators to characterize microelectronics materials by Spectroscopic Ellipsometry. |
| 15:30 |
Coffee break - Main Hall |
| 15:50 |
Joint Poster Session (Part I) - Monday & Wednesday - Main Hall |
| 15:50 |
#H/PI.01 |
Poster |
Bożena B. Bierska-Piech |
The optimalization of the registration condition for the X-ray reflectivity of real multilayer thin films |
| 15:50 |
#H/PII.01 |
Poster |
Madhu Bhaskaran |
Effect of multi-layered bottom electrodes on the orientation of stronium-doped lead zirconate titanate thin films |
| 15:50 |
#PI.02 |
Poster |
Maria Branescu |
Raman spectra intensity as a function of the penetration depth of the visible light in the in-situ grown YBCO films |
| 15:50 |
#H/PII.02 |
Poster |
Mariuca Gartner |
TiON as multifunctional nanostructured film |
| 15:50 |
#H/PI.03 |
Poster |
Chikh Houria |
High temperatures X-ray diffraction study of Tantalum – Oxygen phases |
| 15:50 |
#H/PII.03 |
Poster |
Hyoun Woo Kim |
Growth and characterization of doped Ga2O3 and SnO2 nanofibers using GaN and Sn powder mixtures |
| 15:50 |
#H/PI.04 |
Poster |
Janusz Jaglarz |
Fourier analysis of optical profilometry and BRDF in paints art investigations |
| 15:50 |
#H/PII.04 |
Poster |
Marc Lamy de la Chapelle |
Surface-enhanced Raman scattering of gold nanowires : role of dipolar and multipolar localized surface plasmons |
| 15:50 |
#H/PI.05 |
Poster |
Ghenadii Korotcenkov |
SnO2 films deposited by spray pyrolysis: Intensity of XRD as a parameter for structural characterization |
| 15:50 |
#H/PII.05 |
Poster |
Tivadar Lohner |
Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ions |
| 15:50 |
#H/PI.06 |
Poster |
Ghenadii Korotcenkov |
Spectroscopic cathodoluminescence study of nanostructured SnO2 films deposited by spray pyrolysis |
| 15:50 |
#H/PII.06 |
Poster |
Marek S. Michalec |
Skew asymmetric arrangement of X-ray diffraction for structural diagnostics of multi-layer semiconductor materials |
| 15:50 |
#H/PI.07 |
Poster |
Jacek Kucytowski |
Influence of Nd dopants to change of lattice parameters in YVO4 single crystals. |
| 15:50 |
#H/PI.08 |
Poster |
István E. Lukács |
Sub-pixel detection of a grid’s node positions for optical diagnostics |
| 15:50 |
#H/PII.08 |
Poster |
Przemysław Romanowski |
Effect of high pressure annealing on defect structure of GaMnAs |
| 15:50 |
#H/PII.09 |
Poster |
Kresimir Salamon |
X-ray study of Ge nanoparticle formation in Ge:SiO2/SiO2 multilayers |
| 15:50 |
#H/PI.09 |
Poster |
Wojciech Maziarz |
Reconstruction of lattice structure of ion-implanted near-surface regions of HgCdTe epitaxial layers |
| 15:50 |
#H/PI.10 |
Poster |
Dmitry Mogilyanski |
Anisotropy of sapphire tube-shaped single crystal |
| 15:50 |
#H/PII.10 |
Poster |
Witold Rzodkiewicz |
Methods of stress investigations in dielectric layer of MIS structures |
| 15:50 |
#H/PI.11 |
Poster |
Károly Somogyi |
Influence of Illumination and Decay of Electrical Resistance of ITO Nanoscale Layers |
| 15:50 |
#H/PII.12 |
Poster |
Károly Somogyi |
An RBS Study of Thin PLD and MOCVD Strontium Copper Oxide Layers |
| 15:50 |
#H/PI.12 |
Poster |
Károly Somogyi |
Surface Scattering Optical Loss Measurements in Thin Oxide Planar Waveguide Layers |
| 15:50 |
#H/PII.13 |
Poster |
Assunta Vigliante |
Advances in X-ray Characterization. |
| 15:50 |
#H/PI.13 |
Poster |
Jung Hyun Jeong |
Luminescence properties of Ca3MgSi2O8:Eu2+ thin film phosphors by a pulsed laser deposition |
| 15:50 |
#H/PII.14 |
Poster |
Fu Lung Wong |
Lifetime improvement of organic light-emitting diodes using silicon oxy-nitride as anode modifier |
| 15:50 |
#H/PI.14 |
Poster |
Rodica Plugaru |
Optical properties of nanocrystalline titanium oxide |
| 15:50 |
#H/PII.15 |
Poster |
Olivier Durand |
Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy |
| 15:50 |
#H/PI.15 |
Poster |
Mariuca Gartner |
Hydoxyapatite films obtained by sol-gel and sputtering methods |
| 15:50 |
#H/PI.16 |
Poster |
Claire C. Ramboz |
Advances in micro-crystalline inclusion multi-elementary analysis (12<Z<92) by coupled absolute PIXE and RBS |
| 15:50 |
#H/PII.16 |
Poster |
Jens-Peter Biethan |
New results in calculating critical thickness and the degree of relaxation for epitaxial grown Silicon-Germanium layers on Silicon |
| 15:50 |
#H/PII.17 |
Poster |
Viatcheslav A. Mishurnyi |
Influence of the substrate orientation on the composition of solid solutions grown by LPE and MOCVD |
| 15:50 |
#H/PI.18 |
Poster |
Ratiba H. Outemzabet |
Highly oriented doped and undoped tin oxide thin films grown on multicrystalline silicon substrate. |
| 15:50 |
#H/PII.18 |
Poster |
Pawel Dominik |
Single crystals of gallium nitride doped with gadolinium- synthesis and properties. |
| 15:50 |
#H/PII.19 |
Poster |
István E. Lukács |
Makyoh-topography study of the swirl defect in Si wafers |
| 15:50 |
#H/PI.19 |
Poster |
Woo-Seok Cheong |
Transparent thin-film transistors with zinc oxide active layer fabricated using metal zinc |
| 15:50 |
#H/PII.20 |
Poster |
Odette Chaix |
Phase transformation during the annealing of thin films in Sr-Cu-O system analyzed with in situ studies by X-ray diffraction and Raman spectroscopy |
| 15:50 |
#H/PI.20 |
Poster |
Hassan Shirazi |
Determination of dislocation density and crystallite size distribution in deformed lath martensite by X-ray peak profile analysis |
| 15:50 |
#H/PI.21 |
Poster |
Przemysław Romanowski |
Structure of Si:Mn annealed under enhanced stress conditions |
September 18th, Tuesday |
|
| 09:00 |
Session II : Advances in XRD characterization of small objects I - room 208 |
| 09:00 |
00:35:00 |
Invited |
Vaclav Holy |
Structural characterization of semiconductor quantum dots by three-dimensional x-ray diffraction mapping in reciprocal space |
| 09:35 |
00:35:00 |
Invited |
Vincent Favre-Nicolin |
Shape and stacking analysis of semiconductor nanowires using grazing-incidence diffraction and coherent scattering on single nanowires |
| 10:35 |
Coffee break - Main Hall |
| 11:00 |
Session III : Optical characterization of small objects - room 208 |
| 11:00 |
00:35:00 |
Invited |
Poul-Erik Hansen |
Fast hybrid scalar and Fourier modal method for scatterometry with least square measurements validation |
| 11:35 |
00:20:00 |
Oral |
Pietro G. Gucciardi |
Nanoscale resolution sub-surface fluorescence imaging with aperture Scanning Near-Field Optical Microscopy |
| 11:55 |
00:20:00 |
Oral |
Josep Ferre-Borrull |
FTIR Characterization of Photonic Bands in 2D Silicon Photonic Crystals |
| 12:15 |
Lunch break - Inner Courtyards |
| 14:00 |
Session IV : Advances in XRD characterization of small objects II-Spatially resolved techniques - room 208 |
| 14:00 |
00:35:00 |
Invited |
John D. Budai |
Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies |
| 15:10 |
00:20:00 |
Oral |
Andrzej Kuczumow |
Production of metallic X-ray capillaries with nanometer-rough reflecting surfaces |
| 15:30 |
Coffee break - Main Hall |
| 15:50 |
Session V : Modulation Spectroscopy - room 208 |
| 15:50 |
00:35:00 |
Invited |
Grzegorz Sęk |
Advances in contactless forms of modulation spectroscopy for probing the optical properties of nano-scale objects |
| 16:25 |
00:35:00 |
Invited |
Jeff Hosea |
Photoreflectance in the mid-infrared : a study of the bandgaps and
spin-orbit splittings of ternary and pentenary InAsSb-based alloys |
| 17:00 |
00:20:00 |
Oral |
Piotr Sitarek |
Surface photovoltage spectroscopy of quantum well
and quantum dot systems |
September 19th, Wednesday |
|
| 09:30 |
Plenary Session - Small Hall (237) |
| 10:30 |
Coffee break - Main Hall |
| 11:00 |
Session VI : Grazing incidence X-ray scattering techniques - room 208 |
| 11:00 |
00:35:00 |
Invited |
Ullrich Pietsch |
Grazing-incidence X-ray diffraction from free-standing InAs/GaAs nanorods |
| 11:35 |
00:35:00 |
Invited |
Alain P. Gibaud |
The analysis of mesostructured thin films by grazing incidence x-ray scattering techniques |
| 12:10 |
00:20:00 |
Oral |
Laura Depero |
The international VAMAS project “X-ray reflectivity measurements for evaluation of thin films and multilayers” for X-Ray metrology |
| 12:30 |
Lunch break - Inner Courtyards |
| 14:00 |
Session VII : Optical Polarization Metrology - room 208 |
| 14:00 |
00:35:00 |
Invited |
Pietro G. Gucciardi |
Study of the light depolarization induced by sharp dielectric and metallic tips and of its effects on the selection rules of polarized Tip-Enhanced Raman Scattering on crystals |
| 14:35 |
00:20:00 |
Oral |
Gerald E. Jellison |
Normal-incidence generalized ellipsometry: learning more about the optics of graphite |
| 14:55 |
00:20:00 |
Oral |
Stergios Logothetidis |
In-Situ and Real-Time Protein Adsorption Study by Spectroscopic Ellipsometry |
| 15:15 |
00:20:00 |
Oral |
Tivadar Lohner |
Ellipsometric and ion beam analytical studies on sputtered and annealed niobium oxide thin films |
| 15:30 |
Coffee break - Main Hall |
| 15:50 |
Joint Poster Session (Part II) - Poster Award Ceremony - Main Hall |
September 20th, Thursday |
|
| 09:00 |
Session VIII : X-ray scattering techniques-Stress and Strain measurements - room 208 |
| 09:00 |
00:35:00 |
Invited |
Davor Balzar |
X-ray Characterization of Crystalline Defects and Strains in Thin Films |
| 09:35 |
00:35:00 |
Invited |
Michel Eberlein |
Influence of crystallographic orientation on local strains in silicon: a combined High-Resolution X-Ray Diffraction and Finite Element Modelling investigation |
| 10:10 |
00:20:00 |
Oral |
Emil Zolotoyabko |
Strain measurements with depth resolution by energy-variable X-ray diffraction |
| 10:30 |
Coffee break - Main Hall |
| 11:00 |
Session IX : Characterization of functional oxides - room 208 |
| 11:00 |
00:35:00 |
Invited |
Alexandre Boulle |
Investigation of strain and strain relaxation in functional epitaxial oxides using X-ray scattering techniques |
| 11:35 |
00:20:00 |
Oral |
Karolina Galicka-Fau |
Thickness determination of monolayered or multilayered SrZrO3 thin films using XRD reflectometry |
| 11:55 |
00:20:00 |
Oral |
Gerald E. Jellison |
Photoelectrochemical studies of semiconducting photoanodes for hydrogen production via water dissociation |
| 12:15 |
00:20:00 |
Oral |
Ciceron A. Berbecaru |
Ceramic materials Ba (1-x) SrxTiO3 for electronics – synthesis and characterization |
| 12:35 |
Lunch break - Inner Courtyards |
| 14:00 |
Session X : NATCO Workshop I - room 208 |
| 14:10 |
00:20:00 |
Oral |
Michael J. Nolan |
Dopant Ionic Radius and Electronic Structure Effects on the Transparency of Doped Cu2O Transparent Conducting Oxide |
| 14:30 |
00:20:00 |
Oral |
Mircea Modreanu |
Investigation on optical properties and conduction mechanism of p-type SrCu2O2 |
| 14:50 |
00:20:00 |
Oral |
Evie L. Papadopoulou |
The effect of PLD deposition parameters on the properties of p-SrCu2O2/n-Si diodes |
| 15:10 |
00:20:00 |
Oral |
Ekaterina Chikoidze |
Effect of Chlorine doping on electrical and optical properties of ZnO thin films |
| 15:30 |
Coffee break - Main Hall |
| 15:50 |
Session XI : NATCO Workshop II - room 208 |
| 15:50 |
00:20:00 |
Oral |
Jean-Luc Deschanvres |
Study of the growth conditions of SrCu2O2 thin films deposited by injection MOCVD |
| 16:10 |
00:20:00 |
Oral |
Michael J. Nolan |
Defects and the Origin of p-Type Conductivity in Cu2O: a First Principles Investigation |
| 16:30 |
00:20:00 |
Oral |
Károly Somogyi |
Combination of the Optical Waveguide Lightmode Spectroscopy Method with Electrochemical Measurements |
| 16:50 |
00:20:00 |
Oral |
Elias Aperathitis |
Optical properties of ZnN thin films fabricated by rf-sputtering from ZnN target |
| 17:10 |
00:20:00 |
Oral |
Antonis Kondilis |
Derivation of the complex refractive index in the infrared region of the spectrum from the analysis of optical measurements |
September 21st, Friday |
|
| 09:00 |
Session XII : Characterisation of functional Materials - room 208 |
| 09:00 |
00:20:00 |
Oral |
Martina Von Der Ahe |
An old technique (Umweganregungen) for X-ray characterization of an epitaxial new material ( Chromium doped GaN) |
| 09:20 |
00:20:00 |
Oral |
Evie L. Papadopoulou |
Undoped and Al-doped ZnO films with tuned properties by pulsed laser deposition |
| 09:40 |
00:20:00 |
Oral |
Nicolae Tomozeiu |
Electrical Conduction and Dielectric Relaxation of a-SiOx (0<x<2) Thin Films Deposited by Reactive r.f. Magnetron Sputtering |
| 10:00 |
00:20:00 |
Oral |
Vladimir Egorov |
Possibilities of thin film multilayer structures study by X-ray and ion beam complex of nondestructive methods |
| 10:30 |
Coffee break - Main Hall |
| 11:00 |
Round table - Future trends in Optical and X-ray metrologies - room 208 |
| 12:30 |
Lunch break - Inner Courtyards |
