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- Jens-Peter Biethan
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phone:
+49-6151-163462
fax:
+49-6151-164367
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Affiliation:
Darmstadt University of Technology, Department of High Frequency Electronics
address:
Merckstr. 25, Darmstadt, 64283,
Germany
phone:
fax:
web:
http://www.hf.e-technik.tu-darmstadt.de/en/labs/mwe/index.php
Participant:
E-MRS Fall Meeting 2007
began:
2007-09-17
ended:
2007-11-30
Presented:
E-MRS Fall Meeting 2007
New results in calculating critical thickness and the degree of relaxation for epitaxial grown Silicon-Germanium layers on Silicon
Participant:
E-MRS Fall Meeting 2008
began:
2008-09-15
ended:
2008-09-19
Presented:
E-MRS Fall Meeting 2008
In situ interferometry characterization of MOCVD grown ZnO on (100)-silicon
Participant:
E-MRS Fall Meeting 2009
began:
2010-09-14
ended:
2010-09-18
Presented:
Publications:
In situ interferometry characterization of MOCVD grown ZnO on (100)-silicon
New results in calculating critical thickness and the degree of relaxation for epitaxial grown Silicon-Germanium layers on Silicon
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