E-MRS Fall Meeting 2007

 on-line journal

No.
 Presenting person
 Title
Adrien Tribu Optical properties of ZnSe and CdSe/ZnSe single nanowires.
H/PII.01 Madhu Bhaskaran Effect of multi-layered bottom electrodes on the orientation of stronium-doped lead zirconate titanate thin films
H/PI.01 Bożena B. Bierska-Piech The optimalization of the registration condition for the X-ray reflectivity of real multilayer thin films
PI.02 Maria Branescu Raman spectra intensity as a function of the penetration depth of the visible light in the in-situ grown YBCO films
H/PII.02 Mariuca Gartner TiON as multifunctional nanostructured film
H/PI.03 Chikh Houria High temperatures X-ray diffraction study of Tantalum – Oxygen phases
H/PII.03 Hyoun Woo Kim Growth and characterization of doped Ga2O3 and SnO2 nanofibers using GaN and Sn powder mixtures
H/PI.04 Janusz Jaglarz Fourier analysis of optical profilometry and BRDF in paints art investigations
H/PII.04 Marc Lamy de la Chapelle Surface-enhanced Raman scattering of gold nanowires : role of dipolar and multipolar localized surface plasmons
H/PI.05 Ghenadii Korotcenkov SnO2 films deposited by spray pyrolysis: Intensity of XRD as a parameter for structural characterization
H/PII.05 Tivadar Lohner Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ions
H/PI.06 Ghenadii Korotcenkov Spectroscopic cathodoluminescence study of nanostructured SnO2 films deposited by spray pyrolysis
H/PII.06 Marek S. Michalec Skew asymmetric arrangement of X-ray diffraction for structural diagnostics of multi-layer semiconductor materials
H/PI.07 Jacek Kucytowski Influence of Nd dopants to change of lattice parameters in YVO4 single crystals.
H/PI.08 István E. Lukács Sub-pixel detection of a grid’s node positions for optical diagnostics
H/PII.08 Przemysław Romanowski Effect of high pressure annealing on defect structure of GaMnAs
H/PI.09 Wojciech Maziarz Reconstruction of lattice structure of ion-implanted near-surface regions of HgCdTe epitaxial layers
H/PII.09 Kresimir Salamon X-ray study of Ge nanoparticle formation in Ge:SiO2/SiO2 multilayers
H/PI.10 Dmitry Mogilyanski Anisotropy of sapphire tube-shaped single crystal
H/PII.10 Witold Rzodkiewicz Methods of stress investigations in dielectric layer of MIS structures
H/PI.11 Károly Somogyi Influence of Illumination and Decay of Electrical Resistance of ITO Nanoscale Layers
H/PII.12 Károly Somogyi An RBS Study of Thin PLD and MOCVD Strontium Copper Oxide Layers
H/PI.12 Károly Somogyi Surface Scattering Optical Loss Measurements in Thin Oxide Planar Waveguide Layers
H/PI.13 Jung Hyun Jeong Luminescence properties of Ca3MgSi2O8:Eu2+ thin film phosphors by a pulsed laser deposition
H/PII.13 Assunta Vigliante Advances in X-ray Characterization.
H/PI.14 Rodica Plugaru Optical properties of nanocrystalline titanium oxide
H/PII.14 Fu Lung Wong Lifetime improvement of organic light-emitting diodes using silicon oxy-nitride as anode modifier
H/PII.15 Olivier Durand Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy
H/PI.15 Mariuca Gartner Hydoxyapatite films obtained by sol-gel and sputtering methods
H/PII.16 Jens-Peter Biethan New results in calculating critical thickness and the degree of relaxation for epitaxial grown Silicon-Germanium layers on Silicon
H/PI.16 Claire C. Ramboz Advances in micro-crystalline inclusion multi-elementary analysis (12<Z<92) by coupled absolute PIXE and RBS
H/PII.17 Viatcheslav A. Mishurnyi Influence of the substrate orientation on the composition of solid solutions grown by LPE and MOCVD
H/PII.18 Pawel Dominik Single crystals of gallium nitride doped with gadolinium- synthesis and properties.
H/PI.18 Ratiba H. Outemzabet Highly  oriented doped and undoped tin oxide thin films grown on multicrystalline silicon substrate.
H/PI.19 Woo-Seok Cheong Transparent thin-film transistors with zinc oxide active layer fabricated using metal zinc
H/PII.19 István E. Lukács Makyoh-topography study of the swirl defect in Si wafers
H/PII.20 Odette Chaix Phase transformation during the annealing of thin films in Sr-Cu-O system analyzed with in situ studies by X-ray diffraction and Raman spectroscopy
H/PI.20 Hassan Shirazi Determination of dislocation density and crystallite size distribution in deformed lath martensite by X-ray peak profile analysis
H/PI.21 Przemysław Romanowski Structure of Si:Mn annealed under enhanced stress conditions
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