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Janusz Jaglarz
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Affiliation:
Cracow University of Technology, Institute of Physics
address:
Podchorążych 1, Kraków, 30-084,
Poland
phone:
48-12-637-0666
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web:
Participant:
E-MRS Fall Meeting 2004
began:
2004-09-06
ended:
2004-09-10
Presented:
E-MRS Fall Meeting 2004
Irradiance measurements of electroluminescence PAQ films
E-MRS Fall Meeting 2004
Temperature dependencies of optical parameters of 1H[3,4-b]chinoline films used in electroluminescence devices
E-MRS Fall Meeting 2004
Determination of steel surfaces roughness subjected to etching and oxidation processes
E-MRS Fall Meeting 2004
Determination of optical parameters of polyazomethine thin films by reflectance measurements.
Participant:
E-MRS Fall Meeting 2006
began:
2006-09-04
ended:
2006-09-08
Presented:
E-MRS Fall Meeting 2006
Characterization of Polyazomethine thin films by optical measurements
Participant:
E-MRS Fall Meeting 2007
began:
2007-09-17
ended:
2007-11-30
Presented:
E-MRS Fall Meeting 2007
Fourier analysis of optical profilometry and BRDF in paints art investigations
Participant:
E-MRS Fall Meeting 2008
began:
2008-09-15
ended:
2008-09-19
Presented:
E-MRS Fall Meeting 2008
Antireflective properties of silica films formed in sol-gel processes
Publications:
Antireflective properties of silica films formed in sol-gel processes
Characterization of Polyazomethine thin films by optical measurements
Determination of optical parameters of polyazomethine thin films by reflectance measurements.
Determination of steel surfaces roughness subjected to etching and oxidation processes
Fourier analysis of optical profilometry and BRDF in paints art investigations
Irradiance measurements of electroluminescence PAQ films
Optical investigation of surface morphology of the WC tool-plate subjected to nitriding preprosessing
Study on photovoltaic devices based on polymer and SiC nanoparticles
Surface investigations of TiN layers on different substrates
Temperature dependencies of optical parameters of 1H[3,4-b]chinoline films used in electroluminescence devices
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