The subject of this presentation are TiN layers deposited on steel, silicon and glass substrates. TiN coverages have been prepared by the arc physical vapor deposition (PVD) technique. TiN are well known material used in many industrial applications. Particularly the TiN is a very attractive material for creation of hard protective coating layers. The final useful mechanical properties of TiN coating layers are strongly determined by surface morphology. It depends on many factors i.e topography of substrates, deposition technology, mechanical or thermical treatments. For this reasons the optical, AFM and SEM measurements have been done. The optical methods comprised: integrating sphere, double beam reflectometer, XY optical profilometer measurements in the range from 190 nm to 2500 nm. Additionally for refraction n and extinction k coefficients the ellipsometric study has been performed. As a complemented to AFM and SEM method, the BRDF (bidirectional reflection distribution function measurements have been performed. It is based on analysis of scattered radiation intensity from samples for different scatter angles. The power spectral density is proportional to BRDF signal and then it allow to evaluate surface parameters on much bigger than AFM and SEM surface area. The statistical surface parameters of substrates and layers before and after mechanical and thermal treatment have been obtained. The statistic surface make up: PSD (power spectral density), roughness, correlation length and distribution of heights. It allowed to estimate correlation functions of surface statistic before and after deposition and measure surface parameters after mechanical and thermo-mechanical treatments.

• Legal notice:
  

  Copyright (c) Pielaszek Research, all rights reserved.
  The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
  In every case, proper references including Author(s) name(s) and URL of this webpage: https://science24.com/paper/7707 must be provided.

1. Antireflective properties of silica films formed in sol-gel processes
2. Fourier analysis of optical profilometry and BRDF in paints art investigations
3. Optical investigation of surface morphology of the WC tool-plate subjected to nitriding preprosessing
4. Study on photovoltaic devices based on polymer and SiC nanoparticles
5. Characterization of Polyazomethine thin films by optical measurements
6. Irradiance measurements of electroluminescence PAQ films
7. Temperature dependencies of optical parameters of 1H[3,4-b]chinoline films used in electroluminescence devices
8. Determination of steel surfaces roughness subjected to etching and oxidation processes
9. Determination of optical parameters of polyazomethine thin films by reflectance measurements.