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dr Olivier Durand
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phone:
+33-1-69415778
fax:
+33-1-69415738
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interest(s):
Affiliation:
Thales Research and Technology
address:
Route Départementale 128, Palaiseau, 91767,
France
phone:
fax:
web:
Participant:
E-MRS Fall Meeting 2007
began:
2007-09-17
ended:
2007-11-30
Presented:
E-MRS Fall Meeting 2007
Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy
Publications:
Exploring the optical and electrical properties of SrCu
2
O
2
: theoretical and experimental studies
Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy
Investigation on optical properties and conduction mechanism of p-type SrCu
2
O
2
Phase transformation during the annealing of thin films in Sr-Cu-O system analyzed with in situ studies by X-ray diffraction and Raman spectroscopy
Thickness determination of monolayered or multilayered SrZrO
3
thin films using XRD reflectometry
Study of the growth conditions of SrCu
2
O
2
thin films deposited by injection MOCVD
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