Time
|
Duration
|
Type
|
Presenting person
|
Title
|
September 17th, Monday |
|
| 14:00 |
00:35:00 |
Invited |
James N. Hilfiker |
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry |
| 14:35 |
00:20:00 |
Oral |
Peter Petrik |
Nanocrystals characterization in porous silicon using model dielectric function |
| 14:55 |
00:20:00 |
Oral |
Jordi Sancho Parramon |
Optical characterization of HfO2 by spectroscopic ellipsometry: dispersion models and direct data inversion |
| 15:15 |
00:20:00 |
Oral |
Mickael Gilliot |
Use of Gaussian Voigt oscillators to characterize microelectronics materials by Spectroscopic Ellipsometry. |
September 18th, Tuesday |
|
| 09:00 |
00:35:00 |
Invited |
Vaclav Holy |
Structural characterization of semiconductor quantum dots by three-dimensional x-ray diffraction mapping in reciprocal space |
| 09:35 |
00:35:00 |
Invited |
Vincent Favre-Nicolin |
Shape and stacking analysis of semiconductor nanowires using grazing-incidence diffraction and coherent scattering on single nanowires |
| 11:00 |
00:35:00 |
Invited |
Poul-Erik Hansen |
Fast hybrid scalar and Fourier modal method for scatterometry with least square measurements validation |
| 11:35 |
00:20:00 |
Oral |
Pietro G. Gucciardi |
Nanoscale resolution sub-surface fluorescence imaging with aperture Scanning Near-Field Optical Microscopy |
| 11:55 |
00:20:00 |
Oral |
Josep Ferre-Borrull |
FTIR Characterization of Photonic Bands in 2D Silicon Photonic Crystals |
| 14:00 |
00:35:00 |
Invited |
John D. Budai |
Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies |
| 15:10 |
00:20:00 |
Oral |
Andrzej Kuczumow |
Production of metallic X-ray capillaries with nanometer-rough reflecting surfaces |
| 15:50 |
00:35:00 |
Invited |
Grzegorz Sęk |
Advances in contactless forms of modulation spectroscopy for probing the optical properties of nano-scale objects |
| 16:25 |
00:35:00 |
Invited |
Jeff Hosea |
Photoreflectance in the mid-infrared : a study of the bandgaps and
spin-orbit splittings of ternary and pentenary InAsSb-based alloys |
| 17:00 |
00:20:00 |
Oral |
Piotr Sitarek |
Surface photovoltage spectroscopy of quantum well
and quantum dot systems |
September 19th, Wednesday |
|
| 11:00 |
00:35:00 |
Invited |
Ullrich Pietsch |
Grazing-incidence X-ray diffraction from free-standing InAs/GaAs nanorods |
| 11:35 |
00:35:00 |
Invited |
Alain P. Gibaud |
The analysis of mesostructured thin films by grazing incidence x-ray scattering techniques |
| 12:10 |
00:20:00 |
Oral |
Laura Depero |
The international VAMAS project “X-ray reflectivity measurements for evaluation of thin films and multilayers” for X-Ray metrology |
| 14:00 |
00:35:00 |
Invited |
Pietro G. Gucciardi |
Study of the light depolarization induced by sharp dielectric and metallic tips and of its effects on the selection rules of polarized Tip-Enhanced Raman Scattering on crystals |
| 14:35 |
00:20:00 |
Oral |
Gerald E. Jellison |
Normal-incidence generalized ellipsometry: learning more about the optics of graphite |
| 14:55 |
00:20:00 |
Oral |
Stergios Logothetidis |
In-Situ and Real-Time Protein Adsorption Study by Spectroscopic Ellipsometry |
| 15:15 |
00:20:00 |
Oral |
Tivadar Lohner |
Ellipsometric and ion beam analytical studies on sputtered and annealed niobium oxide thin films |
September 20th, Thursday |
|
| 09:00 |
00:35:00 |
Invited |
Davor Balzar |
X-ray Characterization of Crystalline Defects and Strains in Thin Films |
| 09:35 |
00:35:00 |
Invited |
Michel Eberlein |
Influence of crystallographic orientation on local strains in silicon: a combined High-Resolution X-Ray Diffraction and Finite Element Modelling investigation |
| 10:10 |
00:20:00 |
Oral |
Emil Zolotoyabko |
Strain measurements with depth resolution by energy-variable X-ray diffraction |
| 11:00 |
00:35:00 |
Invited |
Alexandre Boulle |
Investigation of strain and strain relaxation in functional epitaxial oxides using X-ray scattering techniques |
| 11:35 |
00:20:00 |
Oral |
Karolina Galicka-Fau |
Thickness determination of monolayered or multilayered SrZrO3 thin films using XRD reflectometry |
| 11:55 |
00:20:00 |
Oral |
Gerald E. Jellison |
Photoelectrochemical studies of semiconducting photoanodes for hydrogen production via water dissociation |
| 12:15 |
00:20:00 |
Oral |
Ciceron A. Berbecaru |
Ceramic materials Ba (1-x) SrxTiO3 for electronics – synthesis and characterization |
| 14:10 |
00:20:00 |
Oral |
Michael J. Nolan |
Dopant Ionic Radius and Electronic Structure Effects on the Transparency of Doped Cu2O Transparent Conducting Oxide |
| 14:30 |
00:20:00 |
Oral |
Mircea Modreanu |
Investigation on optical properties and conduction mechanism of p-type SrCu2O2 |
| 14:50 |
00:20:00 |
Oral |
Evie L. Papadopoulou |
The effect of PLD deposition parameters on the properties of p-SrCu2O2/n-Si diodes |
| 15:10 |
00:20:00 |
Oral |
Ekaterina Chikoidze |
Effect of Chlorine doping on electrical and optical properties of ZnO thin films |
| 15:50 |
00:20:00 |
Oral |
Jean-Luc Deschanvres |
Study of the growth conditions of SrCu2O2 thin films deposited by injection MOCVD |
| 16:10 |
00:20:00 |
Oral |
Michael J. Nolan |
Defects and the Origin of p-Type Conductivity in Cu2O: a First Principles Investigation |
| 16:30 |
00:20:00 |
Oral |
Károly Somogyi |
Combination of the Optical Waveguide Lightmode Spectroscopy Method with Electrochemical Measurements |
| 16:50 |
00:20:00 |
Oral |
Elias Aperathitis |
Optical properties of ZnN thin films fabricated by rf-sputtering from ZnN target |
| 17:10 |
00:20:00 |
Oral |
Antonis Kondilis |
Derivation of the complex refractive index in the infrared region of the spectrum from the analysis of optical measurements |
September 21st, Friday |
|
| 09:00 |
00:20:00 |
Oral |
Martina Von Der Ahe |
An old technique (Umweganregungen) for X-ray characterization of an epitaxial new material ( Chromium doped GaN) |
| 09:20 |
00:20:00 |
Oral |
Evie L. Papadopoulou |
Undoped and Al-doped ZnO films with tuned properties by pulsed laser deposition |
| 09:40 |
00:20:00 |
Oral |
Nicolae Tomozeiu |
Electrical Conduction and Dielectric Relaxation of a-SiOx (0<x<2) Thin Films Deposited by Reactive r.f. Magnetron Sputtering |
| 10:00 |
00:20:00 |
Oral |
Vladimir Egorov |
Possibilities of thin film multilayer structures study by X-ray and ion beam complex of nondestructive methods |
