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Photoreflectance in the mid-infrared : a study of the bandgaps and spin-orbit splittings of ternary and pentenary InAsSb-based alloys

Jeff Hosea 1Stuart A. Cripps 1Anthony Krier 2Valeriy M. Smirnov 2Peter J. Batty 2Qiandong Zhuang 2Hao-Hsiung Lin 3Po-Wei Liu 3Gg Tsai 3

1. University of Surrey, School of Electronics and Physical Sciences, Guildford Surrey GU2 7XH, United Kingdom
2. Lancaster University, Department of Physics, Lancaster LA1-4YB, United Kingdom
3. National Taiwan University, Dept. of Electronic Engineering, Taipei 1-06, Taiwan

Abstract

Recent interest in mid-infrared (MIR, 2-5 mm) light emitters and detectors is driven by the wide range of potential applications in this spectral region. However, losses by non-radiative Auger recombination paths result in low quantum efficiencies so that many operating devices have to be cooled. Auger rates are sensitive to the fundamental band gap energy, E0 and the spin-orbit splitting energy, D0. However, the band-structures of many narrow gap materials have not been very well characterised which makes engineering their properties very difficult. Part of the reason for this is that modulation spectroscopies such as photo-modulated reflectance (PR), the key non-destructive tool for optical characterisation of semiconductor band-structures, becomes increasingly difficult as one attempts to look further out into the IR. Here, we report on MIR PR of E0 and E0+D0 features in high-quality, InAs-rich InAsSb and GaInAsPSb samples as functions of both temperature and antimony contents ≤22.5%, up to wavelengths as long as 4.75 mm. We find that the temperature dependence of E0 is generally consistent with that accepted in the literature. We are able to measure E0 up to 300K and E0+D0 over a wide temperature range, confirming that D0 is temperature-independent. However, with regard to the behaviour as a function of Sb content, while our PR measurements confirm the literature value of the E0 bowing parameter, we find a dramatically different, and oppositely signed, D0 bowing as compared to the currently accepted value. Due to the importance of D0 in the prediction and interpretation of the performance of InAsSb-based devices, our new result is expected to have an important impact.

 

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Related papers

Presentation: Invited at E-MRS Fall Meeting 2007, Symposium H, by Jeff Hosea
See On-line Journal of E-MRS Fall Meeting 2007

Submitted: 2007-05-14 11:53
Revised:   2009-06-07 00:44