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- Madhu Bhaskaran

e-mail:
phone: +61-3-90012347
fax: +61-3-99252007
web:
interest(s):

Affiliation:

RMIT University, Sch. of Elec. and Comp. Engg., Microelectronics and Materials Technology Centre

address: GPO Box 2476V, Melbourne, Victoria, Melbourne, 3001, Australia
phone:
fax:
web: http://www.rmit.edu.au/

Participant:

E-MRS Fall Meeting 2007

began: 2007-09-17
ended: 2007-11-30
Presented:
E-MRS Fall Meeting 2007
Analytical and finite element modelling of an ohmic contact test structure for low specific contact resistivity
E-MRS Fall Meeting 2007
Effect of multi-layered bottom electrodes on the orientation of stronium-doped lead zirconate titanate thin films
E-MRS Fall Meeting 2007
Investigation of nickel silicide to silicon interface using transmission electron microscopy
E-MRS Fall Meeting 2007
Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques
E-MRS Fall Meeting 2007
In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon

Publications:
  1. Analytical and finite element modelling of an ohmic contact test structure for low specific contact resistivity
  2. Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques
  3. Effect of multi-layered bottom electrodes on the orientation of stronium-doped lead zirconate titanate thin films
  4. Influence of oxygen partial pressure on the composition and orientation of stronium-doped lead zirconate titanate thin films
  5. In situ investigation of thermally influenced phase transformations in (Pb0.92Sr0.08)(Zr0.65Ti0.35)O3 thin films using micro-Raman spectroscopy and X-ray diffraction
  6. In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon
  7. Investigation of composition irregularities and inter-diffusion in strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates
  8. Investigation of nickel silicide to silicon interface using transmission electron microscopy
  9. Piezoelectric response characterization using atomic force microscopy with standard contact-mode imaging



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