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Luminescence properties of Ca3MgSi2O8:Eu2+ thin film phosphors by a pulsed laser deposition

Hyun Kyoung Yang 1Jong Won Chung 1Byung Kee Moon 1Byung Chun Choi 1Jung Hyun Jeong 1Soung Soo Yi 2Jung Hwan Kim 3

1. Department of Physics, Pukyong National Univeristy, 599-1 Daeyeon-Dong Nam-Gu, Busan 608-737, Korea, South
2. Department of Electronic Material Engineering, Silla Univerisiy, San 1-1 Gwaebop-Dong, Sasang-Gu, Busan 617-763, Korea, South
3. Department of Physics, Dong-Eui University, 995 Eomgwangno, Jin-Gu, Busan 617-714, Korea, South

Abstract

It is generally agreed that the phosphorescence of Eu2+ in most of hosts is believed to be caused by the 4f-5d transitions, and the peak positions in the mission spectra depend strongly on the nature of the Eu2+ surroundings in host lattices. Alkaline earth silicates are useful luminescent hosts with stability, and therefore, a great deal of work has been done on rare earth ion activation of these hosts. Ca3MgSi2O8 and Eu2+ ion have been attracted as a host material and an activator for phosphor, respectively. In Ca3MgSi2O8 crystal structure, there are two kinds of coordination number for Ca2+, and so the corresponding r is 0.112 nm (n=8) and 0.118 nm (n=9), respectively. And r is 0.065 nm for Mg2+ with the coordination number 6. Ca3MgSi2O8 thin films have been grown on various substrates using a pulsed laser deposition technique. The substrate was Al2O3 (0001). Thin films were grown under the various oxygen pressures and various substrate temperatures. The crystalline structure, surface morphology characteristics, chemical states, and photoluminescence properties of the Eu-doped Ca3MgSi2O8 films were analyzed using X-ray diffraction (XRD), scanning electron microscope (SEM), and atomic force microscopy (AFM), respectively. The films grown at various deposition conditions show the different crystallinity, surface morphology, and luminescent properties. The room temperature photoluminescence spectra were dominated by the emission peak at 477 nm radiated from the transition of 4f-5d within Eu2+ ions. We found that the luminescence spectra of the films are highly dependent on the crystallinity and surface roughness of the films. And the surface roughness and luminescence intensity of the films showed similar behavior grown on various deposition condition.

 

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Presentation: Poster at E-MRS Fall Meeting 2007, Symposium H, by Jung Hyun Jeong
See On-line Journal of E-MRS Fall Meeting 2007

Submitted: 2007-05-13 10:37
Revised:   2009-06-07 00:44