No.
|
Presenting person
|
Title
|
| B-1 |
Adam Łaszcz |
Transmission Electron Microscopy of Iridium Silicide Contacts for Advanced MOSFET Structures with Schottky Source and Drain |
| B-2 |
Julian Auleytner |
Nanostructure of laser annealed Ge-implanted near-surface Si layers |
| B-3 |
Jadwiga Bak-Misiuk |
Structural and optical properties of high temperature and high pressure treated Si:H,D |
| B-4 |
Ewa Benko |
CBN-Ti/TiN composites: hardness and chemical equilibrium as function of temperature |
| B-5 |
Mikhail F. Bobrov |
Quantum Chemistry Analysis of Electron Density in Cyclophosphazenes and in their Supramolecular Complexes |
| B-6 |
Oleksandr Y. Bonchyk |
X-Ray diffraction studies of radiation defects in CdTe single crystals and epitaxial layers |
| B-7 |
Marta Borowiec |
XANES and X-MCD study of Nd_{2}TM_{17}A_{x} (TM=Fe, Co; A=N,H) compounds |
| B-8 |
Kwun-Bum Chung |
Characteristics of the interface dependent silicide formation for Gd on Si substrate |
| B-9 |
Iraida N. Demchenko |
Investigation of Ge quantum dots buried in silicon matrix by x-ray absorption |
| B-10 |
Jaroslaw Domagala |
Lattice parameters changes of GaMnAs layers induced by annealing |
| B-11 |
Elzbieta Dynowska |
High-pressure phase transition and compressibility of zinc-blende HgZnSe mixed crystals |
| B-12 |
Alexander K. Fedotov |
A set of equations of stress-mediated evolution of the nonequilibrium dopant-defect system in semiconductor crystals |
| B-13 |
Alexander K. Fedotov |
Simulation of oxygen-contained complexes in silicon-silicon interface in cluster approximation |
| B-14 |
Pavlo V. Galiy |
Studies of Interface Carbon Layer Formation on the Cleavage Surfaces of In_4Se_3 Layered Crystals by X-ray Photoelectron and Auger Electron Spectroscopy |
| B-15 |
Krzysztof Godwod |
X-ray study of quartz single crystals implanted with fast Ar ions |
| B-16 |
Joanna N. Gorecka |
Transmission electron microscopy and X-ray diffraction study of \alpha'-Al_2 CO crystals |
| B-17 |
Sebastien Saude |
Sub-surface Investigation of Open-volume Defects induced by Ion Implantation in Zirconia Single Crystals |
| B-18 |
Ewa Grzanka |
Examination of the atomic Pair Distribution Function (PDF) of SiC nanocrystals by in-situ high pressure diffraction |
| B-19 |
Adrianna W. Jabłońska |
Separation of vibrational and static disorder in amorphous In-Se films by EXAFS |
| B-20 |
Katarzyna Jach |
Polymeric flocculation of ceramic slurry obtained by the Direct Coagulation Casting |
| B-21 |
Dariusz Jach |
Processing of the ceramic materials by the gelcasting method |
| B-22 |
SeongJun Kang |
Characteristics of the optimized pentacene thin film transistor via OTS treatment of gate insulator and thermal treatment of pentacene layer |
| B-24 |
Grzegorz P. Karwasz |
Positron-annihilation monitoring of reduction processes in conducting glasses |
| B-25 |
Barbara Klimesz |
Pr^{+3} and Tm^{+3} containing transparent glass ceramic in the GeO_{2}-PbO-PbF_{2}-LnF_{3} system |
| B-26 |
Dorota Klinger |
Defect structure of Sn-implanted Si crystal annealed by nanosecond laser pulse |
| B-27 |
Mirosław Kozłowski |
Microstructure of Fe_3O_4 film grown on Si(100) substrate, investigated by TEM and X-ray methods |
| B-28 |
Krystyna Lawniczak-Jablonska |
Use of element selective methods for characterization of thin films |
| B-29 |
Maria Lefeld-Sosnowska |
Conventional and SR reflection topography of GdCa_4O(BO_3)_3 crystals |
| B-30 |
Beata Leszczyńska-Madej |
Structure and Properties of dynamically compressed Al99,5 and AlCuZr alloy. |
| B-31 |
Bozena Losiewicz |
The electrodeposition of amorphous Ni-P coatings containing TiO_2 and Ti powders |
| B-32 |
Sigitas Mickevicius |
Determination of vanadium valence in hydrated compounds |
| B-33 |
Sigitas Mickevicius |
Photoemission study of the LT-GaAs |
| B-34 |
Robert Mroczka |
Geometrical description of the X-ray capillary and total reflection mirror surfaces with assumed reflection features |
| B-35 |
Iwona Napłoszek-Bilnik |
Electrolytic production and heat-treatment of Ni-based composite layers containing intermetallic phases |
| B-36 |
Waldemar Nowicki |
Phase transitions in the spinel Li_xMn_{3-x}O_4 intercalation compounds. Synchrotron X-ray diffraction studies. |
| B-37 |
Bronislaw A. Orlowski |
Mn doped ZnTe (110) (1x1) surface in Resonant Photoemission study |
| B-38 |
Bronislaw A. Orlowski |
Differential Reflectivity and Photoemission study of ZnTe and CdTe(110) surface |
| B-39 |
Sergey V. Ovsyannikov |
Thermo- and galvanomagnetic characterisation of heterophase structures with variable configuration of inclusions |
| B-40 |
Sergey V. Ovsyannikov |
Investigation of PbSe single crystals under the neutron irradiation |
| B-41 |
Wojciech Paszkowicz |
X-Ray Study of Lattice Parameters of GaN in a Broad Temperature Range |
| B-42 |
Bożena Pietrzyk |
Electron backscatter diffraction as a useful method for alloys microstructure characterization |
| B-43 |
Paweł Piszora |
X-ray powder diffraction investigation of lithium manganese spinel oxides with cubic, tetragonal and orthorhombic structure. |
| B-44 |
Branko Pivac |
GISAXS study of hydrogen implanted silicon |
| B-45 |
Dmytro I. Savytskii |
Twin structure of LSGMO crystals studied by Laue method |
| B-46 |
Anatoliy Senyshyn |
Thermal expansion of NdGaO_3 perovskite |
| B-47 |
Artem Shalimov |
Influence of substrate miscut angle on dislocation density in GaAs/Si heterostructures obtained by HRXRD |
| B-48 |
Czesław Ślusarczyk |
Time-resolved SAXS data analysis of a lamellar two-phase polymer system by means of the correlation function |
| B-49 |
Feliks Stobiecki |
Moessbauer spectroscopy, interlayer coupling and magnetoresistance of irradiated Fe/Cr multilayers |
| B-50 |
Ewa Talik |
XPS investigations of NdGaO3 wafers |
| B-51 |
Zinoviya F. Tsybriy-Ivasiv |
The Hg_{1-x}Cd_xTe Epilayers Investigation and Characterization |
| B-52 |
Leonid Vasylechko |
Crystal structure and thermal expansion of PrGaO_3 in the temperature range 10-1253 K |
| B-53 |
Marius Volmer |
Characterisation of Permalloy based thin films and magnetic multilayers using the magnetoresistance and Hall effect measurements |
| B-54 |
Wojciech Wierzchowski |
Synchrotron X-ray Diffraction studies of silicon implanted with high energy Ar ions after thermal annealing |
| B-55 |
Paweł Wiśniewski |
New water thinnable acrylic - allyl dispersions in die pressing of alumina |
| B-56 |
HANNA WRZESIŃSKA |
Surface morphology, nanomechanical and tribological behaviours of ultrathin nitride superlattice films. |
| B-57 |
Danuta Zymierska |
X-ray diffractometric study of micro-precipitates created by fast nitrogen ions in GaAs single crystal |
| B-58 |
Tim G. Zagurenko |
New Technique for Magnetic Phase Transitions Diagnostics |
| B-59 |
Oleksandr Zakharyash |
Metastable state in Hg_{1-x}Cd_xTe crystals |
| B-60 |
Merabet abdelali |
The segregation of Arsenic and Boron in the interface of a polysilicon on silicon during rapid thermal annealing |
| B-61 |
Valentina V. Arbenina |
Auger Electron Spectroscopy studies of the microstructure and diffusion processes at interfaces of multilayer platings used in laser diode technology |
| B-62 |
Artur Jaśkiewicz |
Breakdown of passivity in Al-Ta and Al-Nb amorphous alloys |
| B-63 |
Patrick Hoffmann |
Photoemission studies of very thin (<10nm) silicon oxynitride (SiO_xN_y) layers formed by PECVD |
| B-64 |
Jacek M. Grochowski |
Tautomeric perferences in solution and crystaline state of new ylidenemalonodinitrile, fungicidal species precursor. |
| B-65 |
Vedran Vonk |
Towards In-Situ Pulsed Laser Deposition |
| B-66 |
Jerzy B. Pełka |
Structure modifications in materials irradiated by ultra-short pulses of VUV free electron laser |
| B-67 |
Jaroslaw Janicki |
SAXS and WAXD real time studies on nanostructures of selected polymer materials |
| B-68 |
Marcin Pisarek |
Effect of cathodic hydrogen charging on catalytic activity of Cu-Hf amorphous alloys |
| B-69 |
Svitlana Stelmakh |
X-ray diffraction studies of thermal properties of bulk- and surface-atoms of nanocrystalline SiC |
