Time
|
Duration
|
Type
|
Presenting person
|
Title
|
September 15th, Monday |
|
| 14:00 |
00:30:00 |
invited oral |
tilo baumbach |
X-ray imaging of semiconductor micro- and nanostructures in real and reciprocal space |
| 14:30 |
00:30:00 |
invited oral |
Marco Di Michiel |
In-Situ High Energy Ultra-Fast X-Ray Micro-Tomography |
| 15:00 |
00:30:00 |
invited oral |
Julian Stangl |
High resolution x-ray scattering from self-organized nanostructures |
| 15:50 |
00:15:00 |
oral |
Jürgen Härtwig |
Characterization of defects in protein crystals by means of synchrotron multiple-crystal topography and reciprocal space mapping |
| 16:05 |
00:15:00 |
oral |
Natalia M. Shmidt |
Multifractal analysis in diagnostics of nanostructures |
| 16:20 |
00:15:00 |
oral |
Grzegorz Jurczak |
Modelling of indium rich clusters in MOCVD InGaN/GaN multilayers |
| 16:35 |
00:15:00 |
oral |
Wojciech Szuszkiewicz |
Structure characterisation of MBE-grown ZnSe:Cr layers |
September 16th, Tuesday |
|
| 11:00 |
00:30:00 |
invited oral |
Wolfgang Neumann |
Quantitative TEM analysis of quantum structures |
| 11:30 |
00:30:00 |
invited oral |
Piotr Dłużewski |
Electron diffraction and microscopy investigations of nanocrystals envelope |
| 12:00 |
00:30:00 |
invited oral |
Wilfried Wurth |
Soft X-Ray Spectroscopy of Clusters, Surfaces, and Interfaces |
| 14:00 |
00:30:00 |
invited oral |
Wroblewski Thomas |
Materials characterization using high flux diffraction. |
| 14:30 |
00:30:00 |
invited oral |
Grzegorz P. Karwasz |
Application of positron annihilation techniques in semiconductor studies |
| 15:00 |
00:30:00 |
invited oral |
Ann Terry |
Diffraction studies of the thickening transition in ideal polymers |
| 15:50 |
00:30:00 |
oral |
Roman Pielaszek |
Precise determination of full Grain Size Distribution from diffraction peak profile as a result of kinematical theory of diffraction for polidispersive nanomaterials |
| 16:20 |
00:15:00 |
oral |
Wojciech Paszkowicz |
Diamond as X-ray Wavelength Standard for Thermal-Expansion Studies Using Synchrotron Sources |
| 16:35 |
00:15:00 |
oral |
Jacek M. Kołoczek |
Computation of powder diffraction patterns for carbon nanotubes. |
| 16:50 |
00:15:00 |
oral |
Edyta Piskorska |
Characterization of the c- BN/ TiC, Ti3SiC2, TiN systems by element selective spectroscopy |
September 17th, Wednesday |
|
| 11:00 |
00:30:00 |
invited oral |
FRANCO RUSTICHELLI |
Neutron and synchrotron radiation non-destructive methods for the characterisation of materials for different applications |
| 11:30 |
00:15:00 |
oral |
Deren Yang |
Microstructure of high temperature - pressure treated nitrogen doped Si determined by TEM, PL and X-Ray methods |
| 11:45 |
00:15:00 |
oral |
Yuriy A. Perlovich |
Complete description of structure features of textured metal materials by use of modified X-ray methods and computer data treatment |
| 12:00 |
00:15:00 |
oral |
Mieczysław Woch |
The modern techniques used in the Institute of Nonferrous Metals for manufacturing of metallic materials of specific structure and properties. |
| 12:15 |
00:15:00 |
oral |
Wroblewski Thomas |
Industrial Research and Development with Synchrotron Radiation |
| 14:00 |
00:30:00 |
invited oral |
Larry Margulies |
Microstructure Development in 3D studied by Synchrotron X Rays |
| 14:30 |
00:30:00 |
invited oral |
Bogdan J. Kowalski |
Gallium nitride surface formation and modification by Mn deposition - photoemission studies with use of synchrotron radiation |
| 15:00 |
00:15:00 |
oral |
Slawomir Kret |
Quantitative transmission electron microscopy investigation of localised stress in heterostructures |
| 15:15 |
00:15:00 |
oral |
Kwun-Bum Chung |
Study of GdSi_{2-x} formation in the presence of an interfacial SiO_2 layer |
| 15:50 |
00:15:00 |
oral |
Olivier Pagčs |
Percolation context in Be-based mixed crystals |
September 18th, Thursday |
|
| 09:00 |
00:30:00 |
invited oral |
Frederic OTT |
Surfaces and interfaces characterisation by neutron reflectometry. |
| 09:30 |
00:30:00 |
invited oral |
Radosław Przeniosło |
Magnetic and crystalline microstructure of nanocrystalline metals studied by neutron and synchrotron radiation scattering |
| 10:00 |
00:30:00 |
invited oral |
Yuri L. Slovokhotov |
Atomic structure of nanoparticles: X-ray diffraction and XAFS studies |
| 11:00 |
00:30:00 |
invited oral |
Clemens T. Heske |
Spectroscopic investigation of buried interfaces and liquids with soft x-rays |
| 11:30 |
00:15:00 |
oral |
Elisabeth Holub-Krappe |
The transition to perpendicular magnetization in an ultrathin Co film studied by XMCD and SXRR based magnetometry |
| 11:45 |
00:15:00 |
oral |
Czesław Kapusta |
NMR study of La_{1-x}Sr_{x}MnO_{3} compounds |
| 12:00 |
00:15:00 |
oral |
Bożena B. Bierska-Piech |
SAXS studies on materials inhomogeneous in nanoscale |
| 12:15 |
00:15:00 |
oral |
Michal Kopcewicz |
RF-Mossbauer study of the magnetic properties of nanocrystalline alloys |
| 12:30 |
00:15:00 |
oral |
Ilanit Fisher |
Correlation between the dielectric constant and porosity of nanoporous silica based thin films |
