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Soft X-Ray Spectroscopy of Clusters, Surfaces, and Interfaces |
Wilfried Wurth |
University of Hamburg, Institute for Experimental Physics, Luruper Chausse 149, Hamburg D-22761, Germany |
Abstract |
Modern, third generation, synchrotron radiation sources are superior in flux and brillance compared to second generation sources by many orders of magnitude. Furthermore, they provide soft-x-ray radiation with variable polarization. Hence, new opportunities for soft x-ray spectroscopy have emerged in recent years.
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Presentation: invited oral at E-MRS Fall Meeting 2003, Symposium B, by Wilfried WurthSee On-line Journal of E-MRS Fall Meeting 2003 Submitted: 2003-06-26 12:01 Revised: 2009-06-08 12:55 |