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Piotr Dłużewski
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Affiliation:
Polish Academy of Sciences, Institute of Physics
address:
al. Lotników 32/46, Warszawa, 02-668,
Poland
phone:
+48-22-8436601
fax:
+48-22-8430926
web:
http://www.ifpan.edu.pl
Participant:
E-MRS Fall Meeting 2003
began:
2003-09-15
ended:
2003-09-11
Presented:
E-MRS Fall Meeting 2003
Electron diffraction and microscopy investigations of nanocrystals envelope
Participant:
E-MRS Fall Meeting 2005
began:
2005-09-05
ended:
2005-09-09
Presented:
Publications:
Catalytic growth by molecular beam epitaxy and properties of ZnTe-based semiconductor nanowires
Electron diffraction and microscopy investigations of nanocrystals envelope
Image processing of HREM micrograph for determination size distribution of Co nanocrystals in Cu matrix
Influence of the thin Si cap layer on SiGe quantum dots morphology
MBE growth, structural, magnetic, and electric properties of (In,Ga)As-(Ga,Mn)As core-shell nanowires
Medium scale modeling of the CdTe/ZnTe islands the empirical potential and finite element approach
Microstructure of Fe_3O_4 film grown on Si(100) substrate, investigated by TEM and X-ray methods
Nanoindentation of heterogeneous n-carbon films containing Ni nanocrystals
Promising high quality short period Fe/Fe-N multilayers deposited by the sputtering
Properties of nanostructured carbonaceous films containing Ni nanocrystals
Quantitative study of Cd atoms distribution in CdTe/ZnTe quantum dots superlattice by HRTEM
Quantitative transmission electron microscopy investigation of localised stress in heterostructures
Structure of Si:Mn annealed under enhanced stress conditions
Transmission electron microscopy and X-ray diffraction study of \alpha'-Al_2 CO crystals
Transmission Electron Microscopy characterization of gold nanoparticles
X-ray Absorption Fine Structure study of nickel grains embedded in the carbonaceous films
ZnO and core/shell ZnO/ZnS nanofibers: Characterization and applications
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