Image processing of HREM micrograph for determination size distribution of Co nanocrystals in Cu matrix

Mirosław Kozłowski 1,3Marcin Żak 1Tomasz Wójtowicz 2Pierre Ruterana 2,4Slawomir Kret 1Jerzy Dąbrowski 1Piotr Dłużewski 1

1. Polish Academy of Sciences, Institute of Physics, al. Lotników 32/46, Warszawa 02-668, Poland
2. Laboratoire CRISMAT - UMR 6508, ISMRA et Universite de Caen, 6 Boulevard de Marechal JUIN, Caen 14050, France
3. Industrial Institute of Electronics (PIE), Dluga, Warszawa 00-241, Poland
4. SIFCOM, UMR6176, CNRS-ENSICAEN, 6 Bld Maréchal Juin, Caen 14050, France


Image processing combined with transmission electron microscopy is a powerful tool for investigation of size distribution of nano-objects. The high-resolution, bright- and dark-field images recorded on photo plates were digitalized and used as an input data for image analysis.
The Fourier filtering, autocorrelation, methods were applied for outline determination of Co precipitates.
The influence of digitising condition, size and shape of Fourier masks, and parameters of reference regions will be discussed in respect to obtained results.

Legal notice
  • Legal notice:

    Copyright (c) Pielaszek Research, all rights reserved.
    The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
    In every case, proper references including Author(s) name(s) and URL of this webpage: must be provided.


Related papers
  1. Studies the size of palladium nanoparticles in Pd-C films annealing at different temperatures.
  2. Impact of substrate microstructure on self-induced nucleation and properties of GaN nanowires grown by plasma-assisted MBE
  3. MBE growth, structural, magnetic, and electric properties of (In,Ga)As-(Ga,Mn)As core-shell nanowires
  4. Transmission Electron Microscopy characterization of gold nanoparticles
  5. ZnO and core/shell ZnO/ZnS nanofibers: Characterization and applications
  6. Investigation of InN layers grown by molecular beam epitaxy on Si or GaN templates
  7. Structural properties of InAlN thin layers for HEMT applications
  8. Low frequency noise measurements in InN films
  9. The microstructure and properties of InN layers
  10. TEM investigation of processed  InGaN based laser grown by PAMBE on bulk GaN substrate
  11. Inhomogeneities of InGaN/GaN MOVPE multi quantum wells grown with two temperatures process studied by transmission electron microscopy.
  12. Role of threading dislocations on Indium distribution in InGaN alloys
  13. Optical properties of InN grown on Si(111) substrate
  14. Ferromagnetism in transition-metal doped ZnS
  15. Electronic and magnetic properties of Co-doped ZnO: first principles study
  16. Structure of Si:Mn annealed under enhanced stress conditions
  17. Nanoindentation of heterogeneous n-carbon films containing Ni nanocrystals
  18. X-ray Absorption Fine Structure study of nickel grains embedded in the carbonaceous films
  19. Influence of the thin Si cap layer on SiGe quantum dots morphology
  20. Catalytic growth by molecular beam epitaxy and properties of ZnTe-based semiconductor nanowires
  21. Method of Manganese co-doping of LT ZnO films
  22. Formation of precipitates in Mn doped ZnO layers deposited by magnetron sputtering
  23. The structure of nucleation Zn(Al)O layers for transparent metal oxide application
  24. First-principles calculations of the optical band-gap properties of Mg1-xZnxO alloys
  25. Theoretical studies of ZnS1-xOx alloy band structures
  26. FE and MD simulation of InGaN QD formation induced by stress field of threading dislocations
  27. Strain Relaxation Effect on the Properties of Ultra Thin ZnO Film on Sapphire (0001) Substrates by Pulsed Laser Deposition
  28. Low and high indium fluctuation in MOCVD grown InGaN/GaN as determined by quantitative HRTEM
  29. Finite element modelling of nonlinear elastic and piezoelectric properties of InN and InGaN QDs
  30. Promising high quality short period Fe/Fe-N multilayers deposited by the sputtering
  31. Structural analysis of the behaviour of the ultrathin AlN capping layer interface during the RE implantation and annealing of GaN for electroluminescence applications
  32. Energy and electronic structure of gallium and nitrogen interstitials in GaN Tilt Boundaries
  33. Investigation of InN layers grown by MOCVD and MBE using analytical and high resolution TEM
  34. Interfacial diffusion and precipitation in rf magnetron sputtered Mn doped ZnO layers
  35. The atomic configuration of tilt grain boundaries around <0001> in GaN
  36. First principles study of electronic structure of InN and AlN substitution atomic layers embedded in GaN
  37. Full-potential study of d-electrons effects on the electronic structure of wurtzite and zinc-blende InN
  38. Quantitative study of Cd atoms distribution in CdTe/ZnTe quantum dots superlattice by HRTEM
  39. The atomic structure of defects formed during doping of GaN with rare earth ions
  40. Transmission electron microscopy structural investigations of Tm implanted GaN
  41. Study of photo- and electro-luminescence related with Er3+ ions in GaN:Er
  42. Electron diffraction and microscopy investigations of nanocrystals envelope
  43. Quantitative transmission electron microscopy investigation of localised stress in heterostructures
  44. Microstructure of Fe3O4 film grown on Si(100) substrate, investigated by TEM and X-ray methods
  45. Medium scale modeling of the CdTe/ZnTe islands the empirical potential and finite element approach
  46. Modelling of indium rich clusters in MOCVD InGaN/GaN multilayers
  47. Transmission electron microscopy and X-ray diffraction study of α'-Al2 CO crystals
  48. Nanostructure of laser annealed Ge-implanted near-surface Si layers
  49. Properties of nanostructured carbonaceous films containing Ni nanocrystals

Presentation: poster at E-MRS Fall Meeting 2004, Symposium D, by Marcin Żak
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-08-06 23:14
Revised:   2009-06-08 12:55
© 1998-2022 pielaszek research, all rights reserved Powered by the Conference Engine