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Quantitative transmission electron microscopy investigation of localised stress in heterostructures
|Slawomir Kret 1, Paweł Dłużewski 2, Grzegorz Maciejewski 2, Grzegorz Jurczak 2, Pierre Ruterana 3, Jiakang Chen 3, Piotr Dłużewski , Elżbieta Janik 1|
1. Polish Academy of Sciences, Institute of Physics, al. Lotników 32/46, Warszawa 02-668, Poland
We present methods and results of investigation of the local strain and stress at atomic scale in highly stressed GaN/Saphire and GaAs/CdTe buffer layers.
Presentation: oral at E-MRS Fall Meeting 2003, Symposium B, by Slawomir Kret
See On-line Journal of E-MRS Fall Meeting 2003
Submitted: 2003-05-28 20:40 Revised: 2009-06-08 12:55