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Preparation and characterization of hexagonal MnTe and ZnO layers |
Ewa Przezdziecka 4, Eliana Kaminska 1, Elzbieta Dynowska 2, Elżbieta Janik 2, Renata Butkute 2, Witold Daniel Dobrowolski 2, Maciej Sawicki 4, Henryk Kepa 3, Rafał Jakieła 2,5, Marta Aleszkiewicz 2, Jacek Kossut 4 |
1. Institute of Electron Technology (ITE), al. Lotników 32/46, Warszawa 02-668, Poland |
Abstract |
In the first part of this work we present the results of the investigation of high crystalline quality MnTe layers grown epitaxially by MBE. It is known that the bulk MnTe with hexagonal crystalline structure of NiAs is a magnetic semiconductor with a high Neel temperature (310K) [1]. Thin layers of MnTe exhibit also antiferromagnetic properties, and for this reason, they can be used as the pinning layer in semiconductor spin valves. Characterization of our samples by X-ray diffraction revealed a high crystalline quality of hexagonal structure of NiAs-type.With lattice parameters of the unit cell are a=4.166A and c=6.694A. The optical transmission spectra of MnTe measured at low temperature gave a possibility to evaluate the energy gap (1.7 eV). In order to establish the Neel temperature the neutron diffraction measurements were performed. The temperature of the antiferromagnetic transition for our samples was 284.1K
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Presentation: poster at E-MRS Fall Meeting 2004, Symposium F, by Ewa PrzezdzieckaSee On-line Journal of E-MRS Fall Meeting 2004 Submitted: 2004-05-19 10:42 Revised: 2009-06-08 12:55 |