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Eliana Kaminska
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Affiliation:
Institute of Electron Technology
address:
al. Lotników 32/46, Warszawa, 02-668,
Poland
phone:
(4822)5487792
fax:
(4822)8470631
web:
http://www.neti.ite.waw.pl
Publications:
Characterization of Ir and IrO
2
Schottky contacts on n-type 4H-SiC under high temperature stress
Diffusion barrier properties of reactively sputtered W-Ti-N thin films
Fabrication of GaSb microlenses by photo and e-beam lithography and dry etching
NANOCOMPOSITE PHOTONIC SENSORS: FIRST APPROACH BY THE NANOPHOS INITIATIVE
Optical and magnetooptical properties of the p-type ZnMnO.
Optical properties of p-type ZnO:(N, As, Sb)
Passivation of GaN surface by chemical bath deposition of thin CdS layers
Preparation and characterization of hexagonal MnTe and ZnO layers
Study of Long-Term Stability of Ohmic Contacts to GaN
TaSiN, TiSiN and TiWN diffusion barriers for metallization systems to GaN
Transparent Conducting Oxides as Ohmic Contacts for GaSb-based Thermophotovoltaic Cells
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