We have measured Ni K-edge extended x-ray absorption fine structure (EXAFS) spectra for 300 nm thick carbonaceous films containing Ni clusters of the size in the range 2‑20 nm The films with various nickel concentrations have been deposited onto a Mylar® foil substrate by PVD method. EXAFS measurements have been performed in fluorescence and transmission mode at the A1 beamline at DORIS III in Hamburg.

The EXAFS spectra were interpreted by fitting calculated scattering paths contributions to the experimental contributions extracted from the measured fine structure by Fourier Transform filtering. The analysis was supported by ab initio model calculations (FEFF) performed for distorted fcc structures and structures optimized for Ni₁₃ clusters.

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