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Krystyna Lawniczak-Jablonska
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Affiliation:
Polish Academy of Sciences, Institute of Physics
address:
al. Lotników 32/46, Warszawa, 02-668,
Poland
phone:
+48-22-8436601
fax:
+48-22-8430926
web:
http://www.ifpan.edu.pl
Participant:
E-MRS Fall Meeting 2003
began:
2003-09-15
ended:
2003-09-11
Presented:
E-MRS Fall Meeting 2003
Use of element selective methods for characterization of thin films
E-MRS Fall Meeting 2003
Synchrotron Radiation - Sources and Properties
Participant:
E-MRS Fall Meeting 2004
began:
2004-09-06
ended:
2004-09-10
Presented:
Participant:
IX Krajowe Sympozjum Użytkowników Promieniowania Synchrotronowego
began:
2011-09-26
ended:
2011-09-27
Presented:
IX Krajowe Sympozjum Użytkowników Promieniowania Synchrotronowego
Optimization of technology for contact metallization in electronic devices - XRD and EXAFS studies
IX Krajowe Sympozjum Użytkowników Promieniowania Synchrotronowego
Can we control the process of room temperature ferromagnetic clusters formation in GaMnAs matrix?
IX Krajowe Sympozjum Użytkowników Promieniowania Synchrotronowego
Location of metals in ZnO electrospined nanofibers
Publications:
Analysis of stress in buried Ge layers by means of X-ray fluorescence
Can we control the process of room temperature ferromagnetic clusters formation in GaMnAs matrix?
CBN-Ti/TiN composites: hardness and chemical equilibrium as function of temperature
Characterization of the c- BN/ TiC, Ti3SiC2, TiN systems by element selective spectroscopy
Crystalline structure and surface morphology of Dy_xO_y films grown on Si
Electronic structure of Mn atoms in (Ga,Mn)As layers modified by high temperature annealing
EXAFS investigation of the local atomic structure of di-alanino acid derivative of protoporphyrin IX
Identification of Mg based phases in ilmenites by X-ray absorption spectroscopy
Influence of high temperature annealing on the local atomic structure around Mn atoms and magnetic properties of (Ga,Mn)As layers
Investigation of Ge quantum dots buried in silicon matrix by x-ray absorption
Location of metals in ZnO electrospined nanofibers
Optimization of technology for contact metallization in electronic devices - XRD and EXAFS studies
Phase composition study of natural minerals used as a source of white pigment production
Synchrotron Radiation - Sources and Properties
The single particles approach of x-ray miroanalysis for estimation a phase composition of altered ilmenite used in pigments production
Total electron yield X- ray absorption applied for hard materials studies
Use of element selective methods for characterization of thin films
X-ray fluorescence detection of iron in diaminoacid derivatives of protoporhyrin IX.
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