Variation of unit-cell size of indium nitride with temperature has been studied in Refs. [1-3]. The low-temperature range has been only partially explored up to now. In the present study, the lattice parameters for indium nitride were determined using X-ray powder diffraction at a synchrotron radiation source (beamline B2, Hasylab/DESY, Hamburg) in the temperature range from 22 K up to 310 K. An image-plate detector was applied for data collection. The wavelength was calibrated using internal diamond standard, according to the method described in Ref. [4]. The lattice parameters a and c behave in a similar way: they are virtually constant below about 130 K. In the range 200 to 300 K the variation is close to a linear one. Discussion of the results will involve the earlier studies of thermal expansion of indium nitride.

1. Paszkowicz W, Adamczyk J, Krukowski S, Leszczynski M, Porowski S, Sokolowski JA, Michalec M, Lasocha W, Philos, Mag, A 79 (1999) 1145-1154
2. Paszkowicz W, Cerny R, Krukowski S, Powder Diffr. 18 (2003) 114-121
3. Wang K, Reeber RR, Appl. Phys. Lett. 79 (2001) 1602-1604
4. Paszkowicz W, Knapp M, Baehtz C, Minikayev R, Piszora P, Jiang JZ, Bacewicz R, J. Alloys Compds. 382 (2004) 107-111

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