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Surface strain in nanocrystalline GaN and SiC; x-ray diffraction study

Bogdan F. Palosz 6,  Ewa Grzanka 5,6,  Stanisław Gierlotka 6,  Svitlana Stelmakh 6,  Roman Pielaszek 5,6,  Ulrich Bismayer 2,  J. Neuefeind ,  J. F. Janik 3

1. Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland
2. University of Hamburg, Mineralogisch-Pertographisches Institut, Hamburg, Germany
3. AGH University of Science and Technology (AGH), al. Mickiewicza 30, Kraków 30-059, Poland
4. Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland
5. Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland
6. Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland

Abstract

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Submitted: 2003-02-16 17:33
Revised:   2009-06-08 12:55