Study on photovoltaic devices based on polymer and SiC nanoparticles

Jerzy Sanetra ,  Janusz Jaglarz 

Cracow University of Technology, Institute of Physics (PK), Podchorążych 1, Kraków 30-084, Poland


We present a study on potovoltaic devices based on polymer and SiC nanoparticles (~30nm) in the matrix of polythiophen. The photovoltaic cell structure was ITO/polymer with SiC/Al. The photophysics of such photoactive devices are based on photoinduced charge transfer from donor type semiconducting conjugated polymers to acceptor type SiC nanoparticles. In the general context of organic photovoltaics, polymeric materials have a cutting edge since they combine the photoelectrical properties of semiconductors with the large scale/ low cost technology of polymeric materials.

For determination of basic parameters these new materials, the optical investigations have been performed. The optical methods comprised: integrating sphere, double beam reflectometer, XY optical profilometer measurements in the range from 190 nm to 2500 nm. Additionally for refraction n and extinction k coefficients the ellipsometric study has been done.


Legal notice
  • Legal notice:

    Copyright (c) Pielaszek Research, all rights reserved.
    The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
    In every case, proper references including Author(s) name(s) and URL of this webpage: must be provided.


Related papers
  1. Antireflective properties of silica films formed in sol-gel processes
  2. Fourier analysis of optical profilometry and BRDF in paints art investigations
  3. Optical investigation of surface morphology of the WC tool-plate subjected to nitriding preprosessing
  4. Characterization of Polyazomethine thin films by optical measurements
  5. Surface investigations of TiN layers on different substrates
  6. Irradiance measurements of electroluminescence PAQ films
  7. Temperature dependencies of optical parameters of 1H[3,4-b]chinoline films used in electroluminescence devices
  8. Determination of steel surfaces roughness subjected to etching and oxidation processes
  9. Determination of optical parameters of polyazomethine thin films by reflectance measurements.

Presentation: Poster at E-MRS Fall Meeting 2006, Symposium D, by Jerzy Sanetra
See On-line Journal of E-MRS Fall Meeting 2006

Submitted: 2006-05-17 22:17
Revised:   2009-06-07 00:44