Fourier analysis of optical profilometry and BRDF in paints art investigations

Janusz Jaglarz 

Cracow University of Technology, Institute of Physics (PK), Podchorążych 1, Kraków 30-084, Poland


The scope of this work is concerned with paints (i.e manual painting) and manual/maschine polishing of metallic surfaces. The optical profilometry (OP) by the measurements of scattered light scattered gives many information about surface topography, optical indices, and thickness of films in cases of their occurring as a resultant those factors. Combined PO investigations with for example mechanical profilometry allow to separate light scattering produced by surface topography from another another scatterings as volume or material scatterings. - To be continued


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Presentation: Poster at E-MRS Fall Meeting 2007, Symposium H, by Janusz Jaglarz
See On-line Journal of E-MRS Fall Meeting 2007

Submitted: 2007-05-12 22:16
Revised:   2009-06-07 00:44