Determination of optical parameters of polyazomethine thin films by reflectance measurements.
|Janusz Jaglarz 1, Jan Cisowski 1,2, Jan Jurusik 2|
1. Cracow University of Technology, Institute of Physics (PK), Podchorążych 1, Kraków 30-084, Poland
The results of study of the total, diffuse and specular reflectance of thin poliazomethine films on fused sillica and Si substrates are reported. The layers was deposited by polycondensation method of initial substrates. The main optical parameters i.e energy loss function, absorption, and scatter refraction coefficient were determined. The values of rms roughness were found using AFM microscope, Talysurf profilometer and integrating sphere.
Presentation: poster at E-MRS Fall Meeting 2004, Symposium I, by Janusz Jaglarz
See On-line Journal of E-MRS Fall Meeting 2004
Submitted: 2004-04-29 16:40 Revised: 2009-06-08 12:55