Janusz Jaglarz

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interest(s):

Affiliation:


Cracow University of Technology, Institute of Physics

address: Podchorążych 1, Kraków, 30-084, Poland
phone: 48-12-637-0666
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web:

Participant:


E-MRS Fall Meeting 2004

began: 2004-09-06
ended: 2004-09-10
Presented:

E-MRS Fall Meeting 2004

Irradiance measurements of electroluminescence PAQ films

E-MRS Fall Meeting 2004

Temperature dependencies of optical parameters of 1H[3,4-b]chinoline films used in electroluminescence devices

E-MRS Fall Meeting 2004

Determination of steel surfaces roughness subjected to etching and oxidation processes

E-MRS Fall Meeting 2004

Determination of optical parameters of polyazomethine thin films by reflectance measurements.

Participant:


E-MRS Fall Meeting 2006

began: 2006-09-04
ended: 2006-09-08
Presented:

E-MRS Fall Meeting 2006

Characterization of Polyazomethine thin films by optical measurements

Participant:


E-MRS Fall Meeting 2007

began: 2007-09-17
ended: 2007-11-30
Presented:

E-MRS Fall Meeting 2007

Fourier analysis of optical profilometry and BRDF in paints art investigations

Participant:


E-MRS Fall Meeting 2008

began: 2008-09-15
ended: 2008-09-19
Presented:

E-MRS Fall Meeting 2008

Antireflective properties of silica films formed in sol-gel processes

Publications:


  1. Antireflective properties of silica films formed in sol-gel processes
  2. Characterization of Polyazomethine thin films by optical measurements
  3. Determination of optical parameters of polyazomethine thin films by reflectance measurements.
  4. Determination of steel surfaces roughness subjected to etching and oxidation processes
  5. Fourier analysis of optical profilometry and BRDF in paints art investigations
  6. Irradiance measurements of electroluminescence PAQ films
  7. Optical investigation of surface morphology of the WC tool-plate subjected to nitriding preprosessing
  8. Study on photovoltaic devices based on polymer and SiC nanoparticles
  9. Surface investigations of TiN layers on different substrates
  10. Temperature dependencies of optical parameters of 1H[3,4-b]chinoline films used in electroluminescence devices



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