Characterization of Polyazomethine thin films by optical measurements

Janusz Jaglarz 1Jan Cisowski 1,2

1. Cracow University of Technology, Institute of Physics (PK), Podchorążych 1, Kraków 30-084, Poland
2. Polish Academy of Sciences, Centre of Polymer Chemistry, M. Sklodowskiej-Curie 34, Zabrze 41-819, Poland

Abstract

Polyazomethine thin films have been prepared by the chemical vapor deposition (CVD) technique via polycondensation process of para-phenylene diamine (PPDA) and terephthal aldehyde (TPA), with Ar as a transport agent. The Ar stream has been divided into two equal streams, one flowing over a boat containing PPDA and the other over a boat with TPA. The PPDA- and TPA source temperatures have been about fixed at 340 K and 326 K, respectively, while the substrate temperature has been kept at 298 K. Then, both streams have merged into one stream, molecules of both monomers have been mixed on their way to the substrate forming finally on it a thin film of polyazomethine. Most of the films have thickness, as estimated by means of an interference microscope, has been of the order of 200 nm. the optical and AFM measurements have been performed. The diffuse reflectance and transmittance investigations prove existence centres of high Rayleigh scattering, They have spherical structures (spherolites) and are created in process of crystallization, in PZT films, being responsible for the volume scattering of light.

 

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Presentation: Poster at E-MRS Fall Meeting 2006, Symposium D, by Janusz Jaglarz
See On-line Journal of E-MRS Fall Meeting 2006

Submitted: 2006-05-17 22:53
Revised:   2009-06-07 00:44