Irradiance measurements of electroluminescence PAQ films

Janusz Jaglarz ,  Jerzy Sanetra 

Cracow University of Technology, Institute of Physics (PK), Podchorążych 1, Kraków 30-084, Poland

Abstract

electroluminescence cells with H[3,4-b]chinoline and 9winylecarbazole [PAQ] layers are promising devices for blue light emitting EL diode. In this work optical reflectance as a function of temperature in copolymers PAQ layers deposited on Si crystalline substrate was measured. Using the Cauchy model of reflectance versus wavelength the refraction coefficient and thickness of the films were determined in temperature ranges from 76 K to 300 K.

 

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Presentation: poster at E-MRS Fall Meeting 2004, Symposium G, by Janusz Jaglarz
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-05-03 22:58
Revised:   2009-06-08 12:55