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Structural and optical characterization of epitaxial layers of CdTe/PbTe grown on BaF2 (111) substrates
|Piotr Dziawa , Badri Taliashvili , Wiktor Domuchowski , Leszek Kowalczyk , Elżbieta Łusakowska , Andrzej Mycielski , Victor Osinniy , Tomasz Story|
Polish Academy of Sciences, Institute of Physics, al. Lotników 32/46, Warszawa 02-668, Poland
CdTe and CdTe/PbTe layers were grown on cleaved BaF2 (111) substrates by molecular beam epitaxy technique employing PbTe, CdTe, and Te2 effusion cells. The growth of the layers was monitored in-situ by RHEED diffraction technique. Crystal structure was examined by standard X-ray diffraction method. The CdTe/PbTe layers are monocrystalline with (111) crystal orientation and exhibit x-ray rocking curve FWHM parameter of 200-300 arcsec for PbTe and 300-600 arcsec for CdTe. The well defined streaky RHEED diffraction pattern was observed during the entire process of growth of both layers indicating a two-dimensional mode of growth with a smooth transition between PbTe and CdTe evidenced by a distinct surface reconstruction.
Presentation: poster at E-MRS Fall Meeting 2004, Symposium F, by Piotr Dziawa
See On-line Journal of E-MRS Fall Meeting 2004
Submitted: 2004-05-21 17:16 Revised: 2009-06-08 12:55