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Estimation of uniformity of GaInNAs quantum wells based on HRXRD measurements |
Katarzyna A. Bielak 1, Damian Pucicki 1, Beata Ściana 1, Damian Radziewicz 1, Mikołaj Badura 1, Wojciech Dawidowski 1, Jarosław Serafińczuk 1, Łukasz Gelczuk 1, Andrej Vincze 2, Marek Tłaczała 1 |
1. Wrocław University of Technology, Faculty of Microsystem Electronics and Photonics (WEMIF), Janiszewskiego 11/17, Wrocław 50-372, Poland |
Abstract |
GaInNAs as a quaternary dilute nitride is promising alloy from application point of view due to possibility of extending the applicability of GaAs technology to longer wavelength using popular GaAs substrate. However epitaxial growth and characterization of GaInNAs layers have remained challenging. Phenomenon of nonuniformity of nitrogen and indium distribution along the growth direction occurs in discussed layers. In case of low dimensional structures such effect could cause step-like shape quantum wells. In this work the results of the high resolution X-ray diffraction (HRXRD) of 3xQWs GaInNAs/GaAs heterostructures will be discussed. Samples were grown by atmospheric pressure metaloorganic vapour phase epitaxy (AP-MOVPE). Authors present difference in simulations of diffraction curves of homogeneous and step-like quantum wells and point out results of measurements suggested a splitting of the quantum wells. The model of step-like quantum is confirmed by transmission electron microscopy (TEM) and secondary ion mass spectroscopy (SIMS). Acknowledgement |
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Presentation: Poster at 15th Summer School on Crystal Growth - ISSCG-15, by Katarzyna A. BielakSee On-line Journal of 15th Summer School on Crystal Growth - ISSCG-15 Submitted: 2013-06-14 13:34 Revised: 2013-06-14 23:04 |