Growth and doping of (Ga,Mn)N epitaxial films
|Gerd Kunert 1, Sylwia Dobkowska 2, Tian Li 3, Carsten Kruse 1, Alberta Bonanni 3, Jörg Grenzer 4, Johannes V. Borany 4, Wiktor Stefanowicz 2, Maciej Sawicki 2, Tomasz Dietl 2,5, Detlef Hommel 1|
1. University of Bremen, Institute of Solid State Physics, P.O. Box 330440, Bremen 28334, Germany
In this work we report on the growth of (Ga,Mn)N films by molecular beam epitaxy (MBE) which show the highest ever reported for any DMS (to our knowledge) field-induced magnetization M(H) . It reaches 150 emu/cm3 at 70 kOe, to be compared the value of 90 emu/cm3 attained in (Ga,Mn)As . Sapphire substrates and MOVPE GaN buffers have been employed. According to high resolution x-ray diffraction (HRXRD) investigations, the films show a linear dependence of the c-lattice parameter on the amount of Mn incorporated (figure 1). Reciprocal space maps reveal that the layers are fully strained. Furthermore, according to high resolution transmission electron microscopy (HRTEM) measurements there are no secondary crystalline phases in these samples. The magnitudes of the Mn concentrations xeff provided by SQUID measurements have been cross-checked by secondary ions mass spectroscopy (SIMS). For a more detailed analysis of the crystalline structure of the layers, Rutherford backscattering (RBS) studies have been performed along the (0001)-direction. It has been found that the signal in the channelling mode drops to 3 % of its magnitude in the random mode, which is among the lowest values reported for GaN and, thus, confirms the high structural quality of the (Ga,Mn)N layers.
1 A. Bonanni et al., Phys. Rev. B, 84, 3 (2011).
2 M. Sawicki et al., Phys. Rev. B, 85, 20 (2012).
3 E. Sarigiannidou et al., Phys. Rev. B, 74, 041306 (2006).
4 J. Blinowski et al., Phys. Rev. B 53, 9524 (1996).
5 K. Sato et al., Rev. Mod. Phys. 82, 1633 (2010), and references therein.
6 G. Kunert et al., Appl. Phys. Lett. 101, 022413 (2012).
7 D. Chiba et al., Appl. Phys. Lett. 90, 122503 (2007).
Figure 1: Change of c-lattice parameter with Mn content, determined by different methods. Measurements belonging to the same sample are marked by a dashed rectangle.
Figure 2: A shift in the fermi-level by Si- or Mg-doping leads to a significant change in the Mn concentrations incorporated under the same growth conditions.
Presentation: Oral at 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17, Topical Session 2, by Gerd Kunert
See On-line Journal of 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17
Submitted: 2013-04-15 17:04 Revised: 2013-07-22 11:32
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