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Nt-Mdt Europe

Ignacy Mościcki 1Grzegorz Kaszyński 1Dimitry Kozodaev 2

1. IGHT s.c., Marszałkowska 80, Warszawa 00-517, Poland
2. NT MDT Europe BV, High Tech Campus 83, Eindhoven 5656, Germany


NT-MDT enjoys a 17-year history in instrumentation created specifically for nanotechnology research, leading the field in originality, quality, and high tech development. We strive for next-generation SPM technology, whether it be in pure modularity that allows a university or industrial lab to start with a cost-effective core product and build to a grand, multi-user research center or the ultimate amalgamation of SPM with related technologies that has resulted in ultramicrotomy for nanotomography and spectroscopy-based instruments that meld the world of imaging with the world of chemical analysis. We believe passionately in pushing the envelope for rapid innovation while still delivering superb customer service.

NT-MDT offers expert service and applications development through more than 20 representative offices and distributor centers around the globe. There are two key branch offices opened in Holland and Ireland. In the past five years, our installed base has grown to over 2000 instruments, promoting growth of both lab and research programs world-wide.

Whether you are engaged every day in nano research or just contemplating it, coupling your specific scientific knowledge and expertise with our competence in instrument creation will produce the highest quality research results currently available.

Our mission is to enable researchers, engineers and developers to conduct nanoscale research by creating ever more perfect nanotechnology instrumentation. Along the way, we maintain a global perspective, always taking into consideration the needs of student in the classroom, the researcher at the cutting edge in the laboratory, and the practicalities of industrial R&D.

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Related papers

Presentation: Exhibition at E-MRS Fall Meeting 2009, Exhibitions, by Ignacy Mościcki
See On-line Journal of E-MRS Fall Meeting 2009

Submitted: 2009-09-04 23:26
Revised:   2009-09-04 23:26