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M. Prujszczyk

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Affiliation:

Institute of Electron Technology

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: (4822)5487792
fax: (4822)8470631
web: http://www.neti.ite.waw.pl

Publications:
  1. Observation of defects in g - irradiated Cz-si annealed under high pressure
  2. Optical and Spectroscopy of nanosized system on Si base after implantation and thermal treatment under enhanced hydrostatic pressure

  3. Structure and related properties of Si:Mn annealed under enhanced hydrostatic pressure

  4. Secondary Ion Mass Spectroscopic Study of Mn-Implanted Silicon after Thermal Annealing
  5. Spectroscopy of Cz-Si samples subjected to implantation and thermal treatment under enhanced hydrostatic pressure.



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