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Parametric refinement of in-situ XRPD data

Rajiv Paneerselvam 1Robert E. Dinnebier 1John S. Evans 2Martin Jansen 1

1. Max-Planck-Institut FKF, Heisenbergstr. 1, Stuttgart D70569, Germany
2. Department of Chemistry, University of Durham, Science Labs, South Road, Durham DH1-3LE, United Kingdom

Abstract

Parametric refinement method [1] enables simple parallel refinements of large amount of XRPD datasets dependent on external variabepdic.pngles. Parametric refinements are carried out by establishing non-physical models that control the convergence of refinement and physical models that describe the evolution of refinable variables with respect to the external factors (temperature, pressure, time, etc.)
Parametric refinement offers ample advantages over normal sequential refinements. Parameterization of variables stabilizes the refinements and improves the precision of refined parameters [1]. It also reduces the number of free variables and creates the possibility of refining non-crystallographic quantities.

As a first step towards parametric refinement a programme that automates the process of single phase sequential Le-Bail/ Pawley refinements has been developed and presented here. The programme interacts with Topas [2] (a powerful software suite for total powder pattern analysis) for carrying out sequential and /or parallel refinements. Topas’ macro language offers the flexibility to introduce user-defined constraint models in a very simple manner.

 To facilitate the automation of sequential phase refinements, a general method to determine the number of phases in in-situ XRPD data has been developed. In this method, the boundaries are determined by comparing the Pearson's correlation coefficients of the neighboring patterns.

 The sequential refinement routine and the phase boundaries determination routines are implemented as an interactive module in the multi pattern, data reduction software Powder 3D [3] with various options for manual interaction.

References
[1] G.W. Stinton and J.S.O. Evans, J. Appl. Cryst  40, 87–95 (2007)
[2] A.A. Coelho,  TOPAS, v4.0. Bruker AXS, (2007).
[3] B. Hinrichsena, R.E. Dinnebier, and M. Jansen, Z. Krist.,Supplement Issue 23 (EPDIC-9
      proceedings), 231-236 (2006)

 

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Related papers

Presentation: Poster at 11th European Powder Diffraction Conference, Poster session, by Rajiv Paneerselvam
See On-line Journal of 11th European Powder Diffraction Conference

Submitted: 2008-04-10 15:45
Revised:   2009-06-07 00:48