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Shearforce-based distance control in scanning electrochemical microscopy |
Mathieu Etienne 1, Alain Walcarius 1, Wolfgang Schuhmann 2 |
1. Laboratoire de Chimie Physique et Microbiologie pour l'Environnement (LCPME), 405, rue de Vandoeuvre, Nancy 54600, France |
Abstract |
Scanning electrochemical microscopy (SECM) allows for the direct high-resolution vizualization of local variations in the (electro)chemical reactivity of solid/liquid, liquid/liquid, and even liquid/air interfaces. For a solid/liquid interface, as the electrode probe approaches the surface in the solution, its current, due to reduction or oxidation of freely-diffusing electroactive species, decreases over an insulating material (negative feedback) and increases over conductive material (positive feedback). These phenomena are often used in classical SECM to determine the tip-to-sample distance for relatively flat and homogeneously conductive samples. The SECM feedback mode has also been used for high resolution imaging of topographic changes and conductivity variations [1]. [1] A.J. Bard, M.V. Mirkin, Scanning Electrochemical Microscopy. Marcel Dekker: New York, 2001. [2] B. Ballestero-Katemann, A. Schulte, W. Schuhmann, Chem. Eur. J., 9, 2025 (2003). [3] M. Etienne, A. Schulte, W. Schuhmann, Electrochem. Commun., 6, 288 (2004). [4]M. Etienne, A. Schulte, S. Mann, G. Jordan, I. Dietzel-Meyer, W. Schuhmann, Anal. Chem., 76, 3682 (2004) [5] M. Etienne, E.C. Anderson, S.R. Evans, W. Schuhmann, I. Fritsch, Anal. Chem., 78, 7317 (2006) [6] M. Etienne, P. Dierkes, T. Erichsen, W. Schuhmann, I. Fritsch, Electroanalysis, 19, 318 (2007) |
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Presentation: Keynote lecture at SMCBS'2007 International Workshop, by Mathieu EtienneSee On-line Journal of SMCBS'2007 International Workshop Submitted: 2007-08-30 16:33 Revised: 2009-06-07 00:44 |