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Exploiting novel precursor chemistry for the growth of oxide thin films by Atomic Layer Deposition |
Lauri Niinistö |
Helsinki University of Technology, Laboratory of Inorganic and Analytical Chemistry (TKK), P.O. Box 6100, Espoo 02015, Finland |
Abstract |
Traditionally, simple and volatile metal compounds, such as halides, alkoxides, and β-diketonates, have been used to grow oxide films by ALD.1 However, these precursors exhibit a number of shortcomings such as low reactivity towards O sources as well as introducing Cl or C impurities into the films.To avoid these and other potential difficulties, it is necessary to explore and develop new precursor chemistry. In recent years, cyclopentadienyl (Cp)-compounds and amido complexes have emerged as ALD precursors.2 Among these, we recently reported novel Cp-compounds to grow HfO2 at high temperatures of 350-500°C.3 Additionally, the ALD of Ga2O3 and Er2O3 using dialkylamido-based and amidinate-containing precursors, respectively, is discussed.4,5 Based on this, the growth of ErxGa2-xO3 is demonstrated from 2 systems, the first one using β-diketonates and O3 while the 2nd one uses Er(CpMe)3, Ga2(NMe2)6 and H2O.6 Finally, we have an example of a dialkylamido-based dimer for oxidation state control in W oxide films, where the reaction between W2(NMe2)6 and H2O maintains W in its +3 state producing W2O3.7 Ta2O5 and BaTiO3 are important materials for microelectronics. Discovery of new ALD precursors could prove useful for these materials, especially for Ba, which lacks stable sources. The new pyrazolate-based precursor for Ta exhibits high thermal stability and produces films of low impurity levels, whereas the novel pyrazolyl-based Ba precursor shows promise towards developing a feasible ALD process for BaTiO3.8,9
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Presentation: Invited at E-MRS Fall Meeting 2007, Symposium C, by Lauri NiinistöSee On-line Journal of E-MRS Fall Meeting 2007 Submitted: 2007-05-24 14:40 Revised: 2009-06-07 00:44 |