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Nanoparticle manipulation using Scanning Probe Techniques:A new approach to Nanotribology |
Udo D. Schwarz 1, Claudia Ritter 1, Dirk Dietzel 2,3, Andre Schirmeisen 2, Harald Fuchs 2,3 |
1. Department of Mechanical Engineering, Yale University, New Haven 06520-8284, United States |
Abstract |
In recent years, considerable efforts have been directed towards the clarification of the atomic origins of friction, largely spurred by the miniaturization of moving components in technological devices. By analyzing the friction between an atomic force microscopy (AFM) cantilever tip and the sample surface, friction force microscopy (FFM) has proven to be a powerful tool for nanotribology. Unfortunately, FFM has some limitations inherent to the experimental configuration. Apart from the limited variety of material combinations, the fixed tip radius makes it difficult to analyze effects as a function of the contact area. However, the contact area dependence is one of the most fundamental yet unsolved current questions in nanotribology. |
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Presentation: Invited at E-MRS Fall Meeting 2007, Symposium J, by Dirk DietzelSee On-line Journal of E-MRS Fall Meeting 2007 Submitted: 2007-05-14 13:58 Revised: 2009-06-07 00:44 |