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|
| Time |
Duration |
Type |
Presenting person |
Title |
||
September 20th, Saturday |
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| 10:05 | 00:30:00 | Oral | Udo S. Welzel | On grain growth and residual stress in thin metal films | ||
| 10:30 | 00:25:00 | Oral | Yuriy Perlovich | X-ray studies in radiation physics: New data on bulk effects of the ion-plasma surface treatment | ||
| 10:55 | 00:25:00 | Oral | FengJu Gao | Investigating interdiffusion in Cu/Ni multilayers from x-ray diffraction and kinetic simulation | ||
| 11:20 | 00:20:00 | Oral | Emmanuel S. Nolot | In-line accurate monitoring of pseudomorphic SiGe layers | ||
| 11:40 | 00:20:00 | Oral | Lea Nichtova | Thickness dependence of crystallization of amorphous and nanocrystalline magnetron deposited TiO2 thin films | ||
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