Bibliography

1

Stanisaw Gierlotka, Bogdan F. Paosz, Roman Pielaszek, Svetlana Stel'makh i S. Doyle, ''Simultaneous analysis of the small- and wide-angle scattering from nanometric SiC based on the ab initio pattern simulation'', Materials Science Forum 278-281 (1998) 106.

2

Roman Pielaszek, Stanisaw Gierlotka, Ewa Grzanka, Svetlana Stel'makh i Bogdan F. Paosz, ''X-ray characterization of nanostructured materials'', Diffusion and Defect Forum 208-209 (2002) 267.

3

William H. Zachariasen, Theory of X-Ray Diffraction in crystals (John Wiley & Sons, New York, 1945).

4

B. E. Warren, X-Ray Diffraction (Addison-Wesley, Reading, Massachusetts, 1969).

5

P. Debye, ''Zerstreuung von Röntgenstrahlen'', Ann.Phys. 46 (1915) 809.

6

A. R. Stokes i A. J. C. Wilson, ''A method of calculating the integral breadths of Debye-Scherrer lines'', Proceedings of the Cambridge Philosophical Society 38 (1942) 313.

7

A. J. C. Wilson, X-ray Optics (The Diffraction of X-rays by Finite and Imperfect Crystals), Methuen's Monographs on Physical Subjects (Methuen, London, 1949).

8

André Guinier i Gérard Fournet, Small-Angle Scattering of X-Rays (John Wiley & Sons, New York, 1955).

9

A. J. C. Wilson, X-ray Optics, wydanie drugie (Methuen, London, 1962).

10

E. F. Bertaut, ''Raies de Debye-Scherrer et repartition des dimensions des domaines de Bragg dans les poudres polycristallines'', Acta Cryst. 3 (1950) 14.

11

J. Ian Langford i D. Louër, ''Diffraction Line Profiles and Scherrer Constants for Materials with Cylindrical Crystallites'', Journal of Applied Crystallography 15 (1982) 20.

12

R. Vargas i D. Louër, ''Diffraction Line Profiles and Scherrer Constants for Materials with Hexagonal Crystallites'', Journal of Applied Crystallography 16 (1983) 512.

13

Paolo Scardi i Matteo Leoni, ''Diffraction line profiles from polydisperse crystalline systems'', Acta Cryst. A57 (2001) 604.

14

Paolo Scardi i Matteo Leoni, ''Whole powder pattern modelling'', Acta Cryst. A58 (2002) 190.

15

N. C. Popa i D. Balzar, ''An analytical approximation for a size-broadened profile given by the lognormal and gamma distributions'', Journal of Applied Crystallography 35 (2002) 338.

16

Physics of New Materials edytor: Francisco E. Fujita, wydanie drugie (Springer-Verlag, Berlin, 1998).

17

Svetlana Stelmakh, Diffraction Studies and Modelling of Polytype Phase Transformation in Polycrystalline Silicon Carbide, PhD thesis, University of Warsaw, Department of Physics, 1997.

18

P. T. B. Shaffer, ''A Review of the Structure of Silicone Carbide'', Acta Cryst. B 25 (1969) 477.

19

T. L. Daulton, R. S. Lewis i S. Amari, ''Polytype Variations in Presolar SiC Grains: Microstructural Characterization by Transmission Electron Microscopy'', Meteoritics & Planetary Science 33 (1998) 4 (Supplement, A37-A38).

20

D. G. Keil, H. F. Calcote i R. J. Gill, w: MRS Symp.Proc, Tom 410, 1996, str. 167.

21

D. Kurtenbach, H. P. Martin i E. Müller, Zeitschrift für Kristallographie 12 (1997) 47 (Suppl.).

22

M. Ueno, M. Yoshida, A. Onodora, O. Shimomura i K. Takemura, ''Stability of the wurtzite-type structure under high pressure: GaN and InN'', Phys. Rev. B 49 (1999) 14.

23

Andrew P. Purdy, ''Ammonothermal Synthesis of Cubic Gallium Nitride'', Chem.Mater. 11 (1999) 1648.

24

Jolin A. Jegier, Stuart McKernam, Andrew P. Purdy i Wayne L. Gladfelter, ''Ammonothermal Conversion of Cyclotrigallazane to GaN: Synthesis of Nanocrystalline and Cubic GaN from [H₂GaNH₂]₃'', Chem.Mater. 12 (2000) 1003.

25

J. F. Janik i J. R. Wells, ''Gallium Imide, {Ga(NH)_3/2}_n, a New Polymeric Precursor for Gallium Nitride Powders'', Chem. Mater. 8 (1996) 2708.

26

H. Baumhauer, Z.Krist. 50 (1912) 33.

27

H. Jagodzinski, ''Eindimensionale Fehlordnung in Kristallen und ihr Einfluss auf die Roentgeninterferenzen. I. Berechnung des Fehlordnungsgrades aus den Roentgenintensitaeten'', Acta Cryst. 2 (1949) 201.

28

H. Jagodzinski, ''Eindimensionale Fehlordnung in Kristallen und ihr Einfluss auf die Roentgeninterferenzen. II. Berechnung der fehlgeordneten dichtesten Kugelpackungen mit Wechselwirkungen der Reichweite 3'', Acta Cryst. 2 (1949) 208.

29

H. Jagodzinski, ''Eindimensionale Fehlordnung in Kristallen und ihr Einfluss auf die Roentgeninterferenzen. III. Vergleich der Berechnungen mit experimentellen Ergebnissen'', Acta Cryst. 2 (1949) 298.

30

J. F. Kelly, P. Barnes i G. R. Fisher, ''The use of synchrotron edge topography to study polytype nearest neighbour relationships in SiC'', Radiat. Phys. Chem. 45 (1995) 509.

31

A. I. Gusev, ''Effects of the nanocrystalline state in solids'', Physics-Uspekhi 41 (1998) 49.

32

Maria Lefeld-Sosnowska, Zjawiska interferencji rentgenowskich pól falowych w doskonaych i zdeformowanych monokrysztaach krzemu (Wydawnictwa Uniwersytetu Warszawskiego, Warszawa, 1987).

33

Jerzy Gronkowski ''Elementy teorii dynamicznej dyfrakcji promieni X'' Materiay dla studentów (skrypt), Warszawa, 1995/96.

34

B. E. Warren, Progress in Metal Physics, Tom 8 (Pergamon, New York, 1959), str. 147.

35

Richard Zallen, Fizyka cia amorficznych (PWN, Warszawa, 1994).

36

B. Palosz, E. Grzanka, S. Gierlotka, S. Stel'makh, R. Pielaszek, U. Bismayer, J. Neuefeind, H.-P. Weber, Th. Proffen, R. Von Dreele i W. Palosz, ''Analysis of short and long range atomic order in nanocrystalline diamonds with application of powder diffractometry'', Zeitschrift für Kristallographie 217 (2002) 1.

37

Robert Osada, Thomas Funkhouser, Bernard Chazelle i David Dobkin, w: ShapeModeling International 2001, 2001.

38

I. N. Bronsztejn i K. A. Siemiendiajew, Matematyka - Poradnik encyklopedyczny (PWN, Warszawa, 1997).

39

Eckhard Limpert, Werner A. Stahel i Markus Abbt, ''Log-normal Distributions across the Science: Keys and Clues'', Bioscience 5 (2001) 341.

40

H. P. Klug i L. E. Alexander, X-Ray Diffraction Procedures (John Wiley & Sons, New York, 1954).

41

T. Ino i N. Minami, ''X-ray Diffraction by Small Crystals'', Acta Cryst. A35 (1979) 163.

42

N. Minami i T. Ino, ''Diffraction from Small Crystallites'', Acta Cryst. A35 (1979) 171.

43

Roman E. Maeder, ''Uniform polyhedra'', The Matematica Journal 3 (Fall 1993) Issue 4.

44

J. Enderlein, ''A package for displaying crystal morphology.'', The Matematica Journal 7 (1997) 72.

45

E. W. Montroll i M. F. Shlesinger, Nonequilibrium Phenomena II. From Stochastics to Hydrodynamics, Tom XI z serii SSM (North Holland, Amsterdam, 1984).

46

H. D. Bale i P. W. Schmidt, ''Small-angle X-ray-scattering investigation of submicroscopic porosity with fractal properties'', Phys. Rev. Lett. 53 (1984) 596.

47

C. E. Krill i R. Birringer, ''Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis'', Philosophical Magazine A 77 (1998) 621.

48

B. E. Warren i B. L. Averbach, J. Appl. Phys. 21 (1950) 595.

49

J. Ian Langford, ''Crystallite Size from Diffraction Data'', International Union of Crystallography Newsletter 24 (2000) 11.

50

G. Porod, ''Die Röntgenkleinwinkelstreuung von dichtgepackten kolloiden Systemen'', Kolloid-Z. 124 (1951) 83.

51

Danuta Rutkowska, Maciej Pilinski i Leszek Rutkowski, Sieci neuronowe, algorytmy genetyczne i systemy rozmyte (PWN, Warszawa-ódz, 1997).

52

Dale W. Schaefer i Keith D. Keefer, ''Structure of Random Porous Materials: Silica Aerogel'', Phys. Rev. Lett. 56 (1986) 2199.

53

Bogdan F. Paosz, Stanisaw Gierlotka, Svetlana Stel'makh, Adam Witek, Roman Pielaszek, Ewa Grzanka, Evgeni A. Ekimov, A. Gavriluk, U. Bismayer i S. Werner, w: Proceedings of 5th National Symposium of Synchrotron Radiation Users, Warsaw, 1999, str. 125.

54

Bogdan F. Paosz, Svetlana Stel'makh, Stanisaw Gierlotka, Evgeni A. Ekimov, Roman Pielaszek, V. Filonenko, V. Gryaznov i A. Gavriluk, ''Sintering of compacts from nanocrystalline diamonds without sintering agent'', Material Research Society Symp. Proceedings 499 (1998) 115.

55

Roman Pielaszek, Svetlana Stel'makh, Stanisaw Gierlotka, Bogdan F. Paosz, Dirk Kurtenbach i U. Bismayer, ''Evolution of microstructure of nanocrystalline SiC under high pressure'', Materials Science Forum 321-324 (1999) 346.

56

Bogdan F. Paosz, Evgeni A. Ekimov, Stanisaw Gierlotka, Svetlana Stel'makh, Roman Pielaszek, Adam Witek, Ewa Grzanka, Adam Presz, H. Boysen i U. Bismayer, ''Preparation of SiC-diamond composites'', HASYLAB Annual Reports I (1998) 587.

57

Bogdan F. Paosz, Stanisaw Gierlotka, Roman Pielaszek, Ewa Grzanka, Piotr Biczyk, Andrzej Grzegorczyk, Evgeni A. Ekimov i U. Bismayer, ''Nanokompozyty diamentu i SiC z Al otrzymane metoda strefowego nasycania nanokrysztaów faza cieka pod wysokim cisnieniem'', Dziaalnosc Naukowa PAN 9 (2000) 88.

58

Roman Pielaszek, Bogdan F. Paosz, Stanisaw Gierlotka, Svetlana Stel'makh, Ewa Grzanka i G. Goerigk, ''Change of microstructure of nanocrystalline SiC powder in high-pressure'', HASYLAB Annual Reports 1999.

59

Roman Pielaszek, M. Avdeev, Ewa Grzanka, Bogdan F. Paosz, Stanisaw Gierlotka i Svetlana Stel'makh, ''Change of microstructure of nanocrystalline SiC and diamond powders in high-pressure high-temperature conditions'', Budapest Neutron Research Center KFKI Annual Reports 1999.

60

Stanisaw Gierlotka, Roman Pielaszek, Bogdan F. Paosz, Ewa Grzanka, Helmut Ehrenberg i Michael Knapp, ''Thermal expansion of diamond-SiC nanocomposites'', HASYLAB Annual Reports 2000.

61

Roman Pielaszek, Bogdan F. Paosz, Stanisaw Gierlotka, Svetlana Stel'makh i U. Bismayer, ''A model of strain distribution in nanocrystalline SiC and diamond at very high pressures, in-situ x-ray diffraction study and computer modeling'', Material Research Society Symp. Proceedings 538 (1999) 561.

62

Roman Pielaszek, Maria Aloszyna, Bogdan F. Paosz, Stanisaw Gierlotka i Svetlana Stel'makh, ''Modelling of strain distribution in non-hydrostatically pressed nanocrystalline SiC, in-situ diffraction study'', Material Research Society Symp. Proceedings 501 (1998) 305.

63

Roman Pielaszek, Stanisaw Gierlotka, Ewa Grzanka, Svetlana Stel'makh i Bogdan F. Paosz, ''Influence of High Pressure on the Polytype Structure of Nanocrystalline GaN'', Diffusion and Defect Forum 208-209 (2002) 189.

64

Ewa Grzanka, Bogdan F. Paosz, Stanisaw Gierlotka, Roman Pielaszek, Konrad Akimow, U. Bismayer i J. F. Janik, ''Distribution of strain in GaN and SiC nanocrystals under extreme pressures'', HASYLAB Annual Reports 2000.

65

Ewa Grzanka, Bogdan F. Paosz, Stanisaw Gierlotka, Roman Pielaszek, Konrad Akimow, U. Bismayer i J. F. Janik, ''Dislocation induced polytype transformation of GaN nanocrystals under extreme pressures'', HASYLAB Annual Reports 2000.

66

Bogdan F. Paosz, Svetlana Stel'makh, Stanisaw Gierlotka, Maria Aloszyna, Roman Pielaszek, Peter Zinn, Thomas Peun, U. Bismayer i D. G. Keil, ''Evolution of disordering in SiC under high pressure high temperature conditions: In-situ powder diffraction study'', Materials Science Forum 278-281 (1998) 612.

67

C. Kittel, Wstep do fizyki ciaa staego, wydanie drugie (PWN, Warszawa, 1970).