Krzysztof Wieteska

Affiliation:

Institute of Atomic Energy

Publications:

1. Characterization of the defect structure in gadolinium orthovanadate single crystals grown by the Czochralski method
2. Damage of gallium arsenide created after irradiation by ultra-short VUV laser pulse
3. Evaluation of the depth extension of the damages induced by FLASH pulses in silicon crystals
4. Observation of defects in g - irradiated Cz-si annealed under high pressure
5. Observation of individual dislocations in 6h and 4h sic by means of back-reflection methods of x-ray diffraction topography
6. Synchrotron topographic studies of domain structure in Czochralski grown Pr_xLa_1-xAlO₃ crystals
7. Synchrotron X-ray Diffraction studies of silicon implanted with high energy Ar ions after thermal annealing
8. Topographic and reflectometric investigation of 4H silicon carbide epitaxial layer deposited at various growth rates
9. X-ray topography of Ca_0.5Sr_0.5NdAlO₄ single crystal