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dr Herve Roussel
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Phase transformation during the annealing of thin films in Sr-Cu-O system analyzed with in situ studies by X-ray diffraction and Raman spectroscopy
X-ray reflectivity analysis of SnO
2
thin films used as gas sensors and biochip components
Study of the growth conditions of SrCu
2
O
2
thin films deposited by injection MOCVD
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