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dr Herve Roussel

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  1. Phase transformation during the annealing of thin films in Sr-Cu-O system analyzed with in situ studies by X-ray diffraction and Raman spectroscopy
  2. X-ray reflectivity analysis of SnO2 thin films used as gas sensors and biochip components
  3.  Study of the growth conditions of SrCu2O2 thin films deposited by injection MOCVD



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