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dr Ken T. Short

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  1. Effect of multi-layered bottom electrodes on the orientation of stronium-doped lead zirconate titanate thin films
  2. Influence of oxygen partial pressure on the composition and orientation of stronium-doped lead zirconate titanate thin films
  3. In situ investigation of thermally influenced phase transformations in (Pb0.92Sr0.08)(Zr0.65Ti0.35)O3 thin films using micro-Raman spectroscopy and X-ray diffraction
  4. In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon
  5. Investigation of composition irregularities and inter-diffusion in strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates
  6. Investigation of nickel silicide to silicon interface using transmission electron microscopy
  7. Piezoelectric response characterization using atomic force microscopy with standard contact-mode imaging



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