Phase Regularities in the Quasi-Binary Thallium(I) Telluride - Zinc Group Metal Telluride Systems

Zbigniew Sztuba ,  Wieslaw Gawel ,  Ewa Zaleska ,  Igor Mucha 

Wroclaw Medical University, Faculty of Pharmacy, Department of Analytical Chemistry, 9 Grodzka street, Wrocław 50-139, Poland

Abstract

The title systems (Tl2Te - (Zn, Cd, Hg)Te) are polythermal cross sections of respective ternary ones of the type Tl-M-Te, where M is any metal. There is a considerable probability of chemical compounds formation in such systems, while (according to former data of other authors) no compound is formed in the systems Tl2Te-ZnTe and Tl2Te-CdTe, and in the Tl2Te-HgTe only one compound was found. The former data were obtained by differential thermal analysis (DTA). This is the reason why we decided to reinvestigate the systems employing another method namely common thermal analysis (TA). From our studies it appeared that in the Tl2Te-ZnTe system one compound was formed of component molar ratio Tl2Te : ZnTe = 9:1 melting congruently at 713 K; in Tl2Te-CdTe two compounds: 6:1 melting congruently at 704 K and 1:3 melting incongruently at 1050 K; in the Tl2Te-HgTe system three compounds: 5:1 melting congruently at 696 K, as well as 1:3 and 1:9 both undergoing decomposition at 653 K and 713 K, respectively.

From the comparison of above data some conclusions may be derived: 1o tendency to compound formation in the series Tl2Te - (ZnTe→CdTe→HgTe) increases with the increase of the metal atomic weight of the second component: one compound→two compounds→three compounds; 2o the compound composition on the Tl2Te side was the nearer to the pure thallium telluride, the greater stability of the second component: 9:1→6:1→5:1, respectively; 3o the melting point of the compound decreases slightly: 713→704→696 K, respectively.

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  1. Phase Diagram for the Tl2Te - In2Te3 System Determined by Thermal Analysis and Concentration Cell EMF Measurements

Presentation: Poster at E-MRS Fall Meeting 2006, Symposium I, by Zbigniew Sztuba
See On-line Journal of E-MRS Fall Meeting 2006

Submitted: 2006-05-15 10:37
Revised:   2009-06-07 00:44
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