Two-dimensional x-ray diffraction has many advantages in stress and texture analysis. This presentation introduces the recent progress in two-dimensional X-ray diffraction as well as its applications in stress and texture analysis. Two-dimensional X-ray diffraction provides far more information than the conventional one-dimensional diffraction. Therefore, two-dimensional diffraction requires new theories and approaches to interpret and analyze the two-dimensional diffraction data. The fundamental equations for both stress measurement and texture measurement are developed with the matrix transformation defined for the two-dimensional diffraction. Stress measurement is based on a direct relationship between the stress tensor and the diffraction cone distortion. The two-dimensional detector collects texture data and background values simultaneously for multiple poles and multiple directions. The presentation also shows the geometry convention, data collection strategy, data interpretation, and data analysis for stress and texture analysis. Several experimental examples have shown that area detectors can measure stress and texture with high sensitivity, high speed and high accuracy.

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1. Two-dimensional X-ray diffraction for micro-area and thin film