X-ray diffraction analysis on micro-area or thin films is always a challenge task due to weak diffraction and poor statistics, especially when dealing with samples containing large grain size, inhomogeneous phase distribution and preferred orientation. Two-dimensional x-ray diffraction has many advantages in microdiffraction and thin film analysis. This presentation introduces the recent progress in two-dimensional X-ray diffraction as well as its applications in microstructure and residual stress analysis on small samples, micro-area on large samples or thin films. The two-dimensional X-ray diffraction provides far more information than the conventional one-dimensional diffraction. Therefore, two-dimensional diffraction requires new theories and approaches to interpret and analyze the two-dimensional diffraction data. The presentation shows the geometry convention, data collection strategy, data interpretation, and data analysis for various applications, such as phase identification, stress and texture analysis.

The fundamental equations for both stress measurement and texture measurement are developed with the matrix transformation defined for the two-dimensional diffraction. Stress measurement is based on a direct relationship between the stress tensor and the diffraction cone distortion. The structure information, such as grain size and preferred orientation, can be observed directly on the two-dimensional diffraction image. Phase identification can be done by integration over a selected range of diffraction rings. The integrated data gives better intensity and statistics, especially for those samples with texture, large grain size, or small quantity. The two-dimensional detector collects texture data and background values simultaneously for multiple poles and multiple directions.

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1. Stress and texture analysis with two-dimensional X-ray diffraction