Tungsten oxides are among the most used materials in hazardous gas detection. In this work, a soft chemical nanocrystalline processing route was demonstrated for the preparation of hexagonal tungsten oxides. The structure of parent phases was studied by scanning and transmission electron microscopy and by X-Ray diffraction. Electrochemical behavior of the films was determined by atomic force microscopy and cyclic voltammetry. The ion insertion properties of the tungsten-based films show a clear dependence on the presence of structural water and on the close packed structure. Sensing properties of the tungsten oxides were tested toward gaseous ammonia at various temperatures. The layers were found to be sensitive in the concentration range of 50-500 ppm at the temperature of 300 °C.

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