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Comef Aparatura Naukowo-Badawcza |
Maria Tymieniecka 1, Bogusław Burak 2, Andrzej Czuma 2, Andrzej Wiśniewski 2, Renata Lewandowska 3, Melanie Gaillet 3, Reiner Brings 3 |
1. COMEF Aparatura Naukowo-Badawcza, Rakowiecka 36/317A, Warsaw 02-532, Poland |
Abstract |
COMEF is a distributor of world leading manufacturers in the field of scientific instruments. Since 1993 we perform sales, high quality service and application trainings for our customers. In year 2000 we have started our business in other Central Europe countries : Czech Republic, Slovak Republic, Ukraine, Lithuania. We offer equipment, full service and technical advice concerning methods of measurement e.g. : Adixen (Alcatel) : Anton Paar, Cameca ; Climats Sapratin; Cressington ; Hitachi High Technologies ; Horiba ; Horiba Jobin Yvon ; JANIS Research Company, Inc ; Newport; PBI Dansensor; Riber ; Secomam ; Setaram ; Spectra-Physics ; Thermo Scientific , Walter+bai ag; Tribotechnic Product Specialty: Hitachi: Electron microscopes: SEM, TEM, STEM; Thermo Fisher Scientific : AUGER and ESCA Spectrometers , EDS and WDS Spectrometers for Electron Microscopy ; Cameca : Magnetic sector SIMS and electron microprobe ( EPMA ), OTAP; Horiba Jobin Yvon: Raman Spectrometers, Emission Spectrometers: ICP, GD-OES, Monochromators, Diffraction Gratings, Spectroscopic Ellispometer; JANIS: Cryosystems; Riber: MBE; Newport: Photonics, Vibration and Motion Control, Optics and Opto-Mechanics, Oriel Light Sources, Spectroscopy Instruments, Detectors and Detection Systems, Optical Filters, Hilger Crystals, Diffraction Gratings; Spectra-Physics: lasers; SETARAM: Calorimeters (CALVET, DSC), high temperatures dilatometers; thermal analyzers (TG, TG-DTA, TG-DSC, TGA-MS, TG-FTIR) The effort put into continuous improvement of quality and customer service motivated us to apply for ISO 9001:2000 certificate. We received it according to TÜV CERT procedure in December 2005. |
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Related papers |
Presentation: Exhibition at E-MRS Fall Meeting 2008, Exhibitions, by Maria TymienieckaSee On-line Journal of E-MRS Fall Meeting 2008 Submitted: 2008-08-06 16:07 Revised: 2009-06-07 00:48 |